Volume 25
Number 2 April 2017
preview of the atom probe tomography special issue
Microwave Frequency Comb from a Semiconductor in a Scanning Tunneling Microscope Mark J. Hagmann, Dmitry A. Yarotski, and Marwan S. Mousa
Laser-assisted atom probe tomography of deformed minerals: a zircon case study Alexandre La Fontaine, Sandra Piazolo, Patrick Trimby, Limei Yang, and Julie Cairney
Eff ect of Cu on nanoscale precipitation evolution and mechanical properties of a Fe-NiAl alloy Qin Shen, Hao Chen, and Wenqing Liu
Electron b eam induced deposition for atom probe tomography specimen capping layers David Diercks, Brian Gorman, and Hans Mulders
Evaluation of analysis conditions for laser-pulsed atom probe tomography: example of cemented tungsten carbide Baptiste Gault, Zirong Peng, Pyuck-Pa Choi, and Dierk Raabe
Nano-scale stoichiometry analysis of a high temperature superconductor by atom probe tomography Stella Pedrazzini, Andrew London, Baptiste Gault, David Saxey, Susannah Speller, Chris Grovenor, Mohsen Danaie, Michael Moody, Philip Edmondson, and Paul Bagot
Additions of Dy, Nb and Ga on microstructure and magnetic properties of Nd2Fe14B/ a-Fe nanocomposite permanent magnetic alloys Xiaohua Tan, Kezhi Ren, Heyun Li, Hui Xu, and Ke Han
Refl ections on the projection of ions in atom probe tomography Baptiste Gault and Frederic de Geuser
Toward the Atomic-Level Mass Analysis of Biomolecules by the Scanning Atom Probe Osamu Nishikawa and Masahiro Taniguchi
Correlating atom probe tomography with atomic resolved scanning transmission electron microscopy: example of segregation at silicon grain boundaries Andreas Stoff ers, Juri Barthel, Christian Liebscher, Baptiste Gault, Oana Cojocaru- Mirédin, Christina Scheu, and Dierk Raabe
Understanding of capping eff ects on the tip shape evolution and on the atom probe data of bulk LaAlO3 using transmission electron microscopy Jaebok Seol, Chang-Min Kwak, Young-Tae Kim, and Chan-Gyung Park
Optimizing Atom Probe analysis with synchronous laser pulsing and voltage pulsing L. Zhao, A. Normand, J. Houard, I. Blum, F. Delaroche, O. Latry, B. Ravelo, and F. Vurpillot
New atom probe tomography reconstruction algorithm for multilayered samples: beyond the hemispherical constraint Nicolas Rolland, Francois Vurpillot, Sebastien Duguay, and Didier Blavette
Atom probe tomography characterization of nanoscale Cu-rich precipitates in 17-4 precipitate hardened stainless steel tempered at diff erent temperatures Zemin Wang, Xulei Fang, Hui Li, and Wenqing Liu
Interface Segregation and Nitrogen Measurement in Fe-Mn-N Steel by Atom Probe Tomography Brian Langelier, Hugo Van Landeghem, Gianluigi Botton, and Hatem Zurob
On the analysis of clustering in an irradiated low alloy reactor pressure vessel steel weld
Kristina Lindgren, Krystyna Stiller, Pål Efsing, and Mattias T uvander
Core-shell structure of intermediate precipitates in a Nb-based Z-phase strengthened 12% Cr steel Masoud Rashidi, Hans-Olof Andrén, and Fang Liu
Single-Ion Deconvolution of Mass-Peak Overlaps for Atom Probe Microscopy Andrew London, Daniel Haley, and Michael Moody
Interfaces in oxides formed on NiAlCr doped with Y,Hf,Ti and B Torben Boll, Krystyna Stiller, Bruce Pint, and Kinga Unocic
Correlating Atom Probe Crystallography Measurements with Transmission Kikuchi Diff raction Data A.J. Breen, K. Babinsky, A.C. Day, K. Eder, C.J. Oakman, P.W. Trimby, S. Primig, J.M. Cairney, and S.P. Ringer
Analysis of Radiation Damage in Light Water Reactors: Comparison of Cluster Analysis Methods for the Analysis of Atom Probe Data Paul Styman, Jonathan Hyde, Gérald Da Costa, Constantinos Hatzoglou, Hannah Weekes, Bertrand Radiguet, Francois Vurpillot, Cristelle Pareige, Auriane Etienne, Giovanni Bonny, Nicolas Castin, Lorenzo Malerba, and Philippe Pareige
Atom probe analysis of ex-situ gas-charged stable hydrides D. Haley, P.A.J. Bagot, and M.P. Moody
Automated atom-by-atom 3D reconstruction of fi eld ion microscopy data Michael Moody, Michal Dagan, Baptiste Gault, George Smith, and Paul Bagot
Modern FIB-Based Site-Specifi c Specimen Preparation for Atom Probe Tomography Prosa, Ty and David Larson
In-situ Atom Probe Deintercalation of Lithium-Manganese-Oxide Björn Pfeiff er, Johannes Maier, Jonas Arlt, and Carsten Nowak
True atomic-scale imaging in three-dimensions: A review of the rebirth of fi eld-ion microscopy Francois Vurpillot; Frédéric Danoix, Matthieu Gilbert, Sebastian Koelling, Michal Dagan, and David Seidman
Detecting Clusters in Atom Probe Data with Gaussian Mixture Models Jennifer Zelenty, Andrew Dahl, Jonathan Hyde, George Smith, and Michael Moody
2017 March •
www.microscopy-today.com doi: 10.1017/S155192951600122X 73 Dear Abbe,
For the last few years I have been sentenced to research management, and I fear I am losing touch with the technical world. I am responsible for my group’s execution of cutting-edge research. In industry terms, that involves generating pretty SEMs which please our upper management. Recently I have seen many color SEMs in online news items. I’m wondering: where can I purchase one of those niſt y color electron microscopes? We all know about green M&Ms, but is there anything I should know
about orange electrons? De-lobed in Cincinnati Dear Lobeless,
It would seem that you and your upper management have been hoodwinked by one of the oldest tricks in the book, namely falsely adding color to a black-and- white image. T is practice was perfected by my dear friend Wallace Nutting who used the technique to peddle his photographs. At one time Wallace employed over 200 colorists who added just the right shades of green, pink, and brown to make it seem as if his photos were in color. Tricks, tricks, tricks! Secretly I think that he did this to get back at those who had chopped the head off of his great-grandfather and stuck in on a pike, but Wallace assured me that it was done solely to amass wealth. T ese days Rechtsverdreher Microscope sellers have found that gullible labs will still fall for this subterfuge. As P.T. Barnum once noted, “A fool and his money will make my wallet fat!” Next time your boss wants a colorized SEM, do what I do. Distribute a stack of photos to a bunch of third graders and ask them to use crayons to make the pictures “pretty.” Choose the best one and tell your boss that it cost $1,500. Buy the kid an ice cream and pocket the diff erence. If you feel threatened by the colorful world around you, put your dark shades on and consult Herr Abbe. He can be reached by contacting his faithful assistant at
jpshield@uga.edu.
Dear Abbe
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