Volume 25 25


Numbe 2 Number


2017 March 2017 March


Feature Article


12 Acceptance Angle Control for Improved Transmission Imaging in an SEM Jason Holm and Robert R. Keller


Contents X-ray Microanalysis


20 Ultra-Low kV EDS – A New Approach to Improved Spatial Resolution, Surface Sensitivity, and Light Element Compositional Imaging and Analysis in the SEM Simon Burgess, James Sagar, James Holland, Xiaobing Li, and Frank Bauer


30 Advanced Chemical Analysis Using an Annular Four-Channel Silicon Drift Detector Ralf Terborg, Andi Kaeppel, Baojun Yu, Max Patzschke, Tobias Salge, and Meiken Falke


36 Large-Area Quantitative Phase Mapping in the Scanning Electron Microscope Keith Thompson


46 Improvements in SDD Effi ciency – From X-ray Counts to Data Tara Nylese and Jens Rafaelsen


About the Cover Meeting Preview


54 Microscopy & Microanalysis 2017 in St. Louis, Missouri Jay Potts, Program Chair


Pioneers


56 Pioneers in Optics: Georges de Buffon Eric Clark


SEM images of single-wall carbon nanotube bundles with metal catalyst particles. Clockwise from upper left: brightfi eld STEM, high-angle annular darkfi eld STEM, marginal brightfi eld STEM, and secondary electron mode. Image width = 1 µm.


See article by Holm and Keller Departments


7 Editorial 8 Carmichael’s Concise Review


58 Industry News 60 Product News 62 Microscopy and Microanalysis Highlights


64 NetNotes 69 Calendar of Meetings 73 Dear Abbe 74 Index of Advertisers


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