From the Editor Happy Birthday MAS
This year we celebrate the 50 th anniversary of the founding of the Microanalysis Society, named in 1967 as the Electron Probe Analysis Society of America. Coincidentally, it is also the 75 th anniversary of the Microscopy Society of America, founded as the Electron Microscope Society of America in 1942. T e cooperation of these societies, particularly in the annual Microscopy & Microanalysis meeting and the peer-reviewed journal Microscopy and Microanalysis , has created one of the world’s most respected partnerships in the dissemination of information concerning these important fi elds.
Non-destructive analysis of elements in a substance began with Moseley’s 1913–14 experiments in Manchester, UK, showing that, when excited by energetic electrons, each element emits a set of relatively simple X-ray lines that are characteristic of only that element. Prior to this, elemental analysis involved destructive wet chemistry using various reagents or light spectroscopy. Soon aſt er Moseley’s discovery, workers began to excite the specimen with continuous radiation from X-ray tubes, which gave rise to X-ray fl uorescence spectrometry, a bulk analysis technique with a spatial resolution on the order of millimeters. T is was the situation until André Guinier’s student Raimond Castaing in Paris incorporated a wavelength-dispersive X-ray spectrometer into a modifi ed transmission electron microscope (TEM) creating the fi rst electron probe microanalyzer in 1949-1951. Castaing’s device had the capability of producing a fi ne beam of energetic electrons capable of exciting X-rays from most of the elements in the periodic table. He worked out experi- mental and mathematical methods that permitted non-destructive quantitative elemental analysis with a spatial resolution on the order of 1 µm, an improvement of three orders of magnitude. While prototype scanning electron microscopes (SEMs) were built in the 1930s and 1940s, poor vacuums and image resolutions inferior to the TEM slowed interest. In the 1950s and 1960s, Charles Oatley and his students in Cambridge, UK, developed the fi rst practical SEM that produced images of surfaces with a depth of fi eld and a resolution many times better than the light microscope. Among Oatley’s challenges were fi nding an effi cient electron detector as well as utilizing early television technology to record the image produced when the focused electron beam was scanned in a raster across the specimen. In 1956 Ellis Cosslett and his student Peter Duncumb, also in Cambridge, combined ideas behind the microprobe and SEM to generate the fi rst composi- tional images in a microscope—elemental maps showing the spatial distribution of elements at the micrometer scale.
The exciting possibilities for these new tools convinced a group of scientists and engineers to form what is now known as the Microanalysis Society. To commemorate the Society’s founding, this issue of Microscopy Today highlights some recent advances in SEM and microanalysis: transmission SEM and X-ray microanalysis with the silicon-driſt detector.
Publication Objective: to provide information of interest to microscopists.
Microscopy Today is a controlled-circulation trade magazine owned by the Microscopy Society of America that is published six times a year in the odd months. Editorial coverage spans all microscopy techniques including light microscopy, scanning probe microscopy, electron microscopy, ion-beam techniques, and the wide range of microanalytical methods. Readers and authors come from both the life sciences and the physical sciences. The typical length of an article is about 2,000 words plus fi gures and tables; feature articles are longer. Interested authors should consult “Instructions for Contributors” on the Microscopy Today website:
www.microscopy-today.com.
ISSN 1551-9295
Disclaimer The Microscopy Society of America and the editors cannot be held responsible for opinions, errors, or for any consequences arising from the use of information contained in Microscopy Today. The appearance of advertising in Microscopy Today does not constitute an endorsement or approval by the Microscopy Society of America of any claims or information found in the advertisements. By submitting a manuscript to Microscopy Today, the author warrants that the article is original or that the author has written permission to use copyrighted material published elsewhere. While the contents of this magazine are believed to be accurate at press time, neither the Microscopy Society of America, the editors, nor the authors can accept legal responsibility for errors or omissions.
© Copyright 2017 by the Microscopy Society of America. All rights reserved.
Editorial Staff
Charles E. Lyman, Editor-in-Chief
charles.lyman@
lehigh.edu (610) 758-4249
Gennifer Levey, Production Manager
glevey@meridianartpro.com (212) 780-0315
Ron Anderson, Executive Editor
randerson20@tampabay.rr.com
Phil Oshel, Technical Editor
oshel1pe@cmich.edu
Robert Price, Associate Editor
bob.price@
uscmed.sc.edu
Stephen Carmichael, Columnist
carmichael.stephen@
mayo.edu
Eric Clark, Pioneers Editor
eclark@magnet.fsu.edu
Steven Barlow, Education Editor
sbarlow@mail.sdsu.edu
Thomas E. Phillips, Consulting Editor
phillipst@missouri.edu
Paul Webster, Calendar Editor
pwebster@usc.edu
John Shields, Humor Editor
jpshield@uga.edu
Nikolaus Cordes, Digital Content Editor
ncordes@lanl.gov
Thomas Kelly, Chief Awards Judge T
omas.kelly@
ametek.com
Advertising Sales M.J. Mrvica Associates, Inc. 2 West Taunton Avenue, Berlin, NJ 08009
mjmrvica@mrvica.com (856) 768-9360
Kelly Miller, Account Manager
kmiller@mrvica.com
Magazine website:
http://www.microscopy-today.com Free subscriptions are available
Publisher Cambridge University Press One Liberty Plaza, 20th Floor New York, New York 10006 (212) 337-5000
Circulation: 18,000
Editorial Board Arlan Benscoter, Lehigh University John Bozzola, Southern Illinois University Peter Crozier, Arizona State University Vinayak Dravid, Northwestern University David Grubb, Cornell University Bryan Huey, University of Connecticut Heather Lowers, U.S. Geological Survey John Mackenzie, North Carolina State Univ. Paul Maddox, U. of North Carolina–Chapel Hill Ania Majewska, U. Rochester Med School Joseph Michael, Sandia National Labs Caroline Miller, Indiana University Brian M. Patterson, Los Alamos National Lab John Reffner, John Jay College, SUNY Ian Robertson, University of Wisconsin Phillip Russell, Appalachian State University Glenn Shipley, Citizen Microscopist Robert Simmons, Georgia State University Paul Voyles, University of Wisconsin Simon Watkins, University of Pittsburgh Cynthia Zeissler, Nat. Inst. of Stds. and Tech. (NIST)
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