Near Infrared Compact Fluorescence Lifetime Measurement System


Hamamatsu’s new NIR Fluorescence Lifetime Measurement System is specifically designed for the measurement of photoluminescence (PL) spectra and lifetime in the visible to near infrared region of thin film semiconductor PV materials.


Features: n Wavelength measurement range from 580 nm to 1400 nm n Measures PL lifetime down to 200 ps using deconvolution n Integrated YAG laser, 532nm n Multipoint measurement (optional) n Low temperature measurement (optional)


Applications: n Solar cell research n Material research


PHOTON IS OUR BUSINESS www.hamamatsu.eu, Freephone: Europe 00 800 800 800 88, USA 1-800 524 0504


VISIT US AT STAND NO. 3.1/E23 HALL 3.1


Page 1  |  Page 2  |  Page 3  |  Page 4  |  Page 5  |  Page 6  |  Page 7  |  Page 8  |  Page 9  |  Page 10  |  Page 11  |  Page 12  |  Page 13  |  Page 14  |  Page 15  |  Page 16  |  Page 17  |  Page 18  |  Page 19  |  Page 20  |  Page 21  |  Page 22  |  Page 23  |  Page 24  |  Page 25  |  Page 26  |  Page 27  |  Page 28