ProductNews
Xradia Unveils 3D X-ray Microscope with Industry’s Largest Working Distance at Highest Resolution
Xradia announced the VersaXRM-500, a new 3D X-ray imaging solution advancing industry and science with a versatile combination of resolution and contrast, and sample flexibility at large working distances. Featuring true submicron spatial resolution at millimeters
to inches from the source, the VersaXRM-500 supports high resolution at large working distances suitable for in situ study using environmental chambers or load cells, as well as non-destructive 4D study (over time) under varying environmental conditions.
Xradia
www.xradia.com
FEI Extends ChemiSTEM Technology to Enable Atomic-level Spectroscopy
FEI Company announced that it is extending its ChemiSTEMTM Technology to enable, for the first time, atomic-level energy dispersive X-ray (EDX) spectroscopy across the periodic
table. Te combination of increased current in an atomic-sized probe by Cs-correction and the increase in X-ray detection sensitivity and beam current of the ChemiSTEM Technology allows results to be obtained within minutes.
FEI Company
www.fei.com
New Semrock UV VersaChrome® Tunable Bandpass Filter
Semrock has expanded the lineup of its VersaChrome® tunable bandpass filter family to seven filters. Te new TBP01-380/16-25×36 VersaChrome filter offers wavelength tunability over the near UV wavelengths by adjusting the angle of incidence with essentially no change
in spectral performance. Tis new filter, along with the just-added TBP01-800/12-25×36, expands VersaChrome coverage outside the visible spectrum to include near-IR and near-UV wavelengths. Te current complete set covers wavelengths from 340–800 nm.
Semrock, Inc.
www.semrock
6-Axis Parallel Positioner: Versatile Miniature Hexapod for Precision Motion Control
PI (Physik Instrumente) L.P., a leading manufacturer of precision parallel kinematics motion control systems, has released a new miniature hexapod. Two versions for standard conditions and for vacuum applications are available. Te new M-811 miniature Hexapod measures only 130 mm in diameter and 115
mm in height. Despite its small size, it can handle loads to 5 kg (11 lbs) and position them in all six degrees of freedom with submicrometer precision.
PI (Physik Instrumente) L.P.
www.pi-usa.us
54
Asylum Research Introduces Electrochemical Strain Microscopy for Energy Storage Research
Te new Electrochemical Strain Microscopy (ESM) imaging technique for Asylum’s CypherTM and MFP-3DTM AFMs is an innovative scanning probe microscopy technique for probing electrochemical reactivity and ionic flows in solids on the sub-ten- nanometer level. ESM is the first technique
that measures ionic currents directly, mapping electrochemical phenomena on the nanoscale. Te capability is invaluable for a broad range of applications for energy generation and storage ranging from batteries to fuel cells.
Asylum Research
www.asylumresearch.com
Hoefer Inc. MacroVue™ UV-25 Variable Intensity Transilluminator
Te NEW MacroVueTM UV-25 Variable Intensity Transilluminator can now be adjusted from 0 to 9,000 µW/cm² covering a larger range of prepar- ative and analytical applications. Te six 8 watt,
302 nm lamps ensure uniform illumination of the 21 × 26 cm viewing area. A hinged clear UV safety cover minimizes personnel exposure to UV rays from the lamps. Optional shortwave 8 watt, 254 nm lamps are available to change illumination from 302 nm to 254 nm.
Hoefer, Inc.
www.hoeferinc.com
New SEM Large-Specimen Sputter Coater from Electron Microscopy Sciences
EMS launched the EMS300 series of sputter coaters, ideally suited for sputtering a single large-diameter specimen up to 200 mm. Te EMS300 is available in three formats: the EMS300R T is a low-cost rotary-pumped coater
for noble metals, the EMS300T T is a turbomolecular-pumped platform ideal for both oxidising and non-oxidising metals, and the EMS300T D is a dual-head system that will sequentially deposit two different metals without the need to break vacuum.
Electron Microscopy Sciences
www.emsdiasum.com
High-Resolution Mapping of Color and Intensity of Micro-Displays with CRAIC Technologies 308 FPD™ Microscope Spectrophotometers
Micro-displays feature ever-smaller components. Component geometries have shrunk so much that standard metrology tools have difficulty accurately measuring color and intensity variations with the degree of spatial resolution required. Enter the 308 FPDTM microscope spectrophotometer from
CRAIC Technologies. Te 308 FPDTM is designed to measure and compare the spectral output, intensity, and color consistency of each microscopic pixel of even the smallest micro-displays.
CRAIC Technologies, Inc.
www.microspectra.com
www.microscopy-today.com • 2011 July
Page 1 |
Page 2 |
Page 3 |
Page 4 |
Page 5 |
Page 6 |
Page 7 |
Page 8 |
Page 9 |
Page 10 |
Page 11 |
Page 12 |
Page 13 |
Page 14 |
Page 15 |
Page 16 |
Page 17 |
Page 18 |
Page 19 |
Page 20 |
Page 21 |
Page 22 |
Page 23 |
Page 24 |
Page 25 |
Page 26 |
Page 27 |
Page 28 |
Page 29 |
Page 30 |
Page 31 |
Page 32 |
Page 33 |
Page 34 |
Page 35 |
Page 36 |
Page 37 |
Page 38 |
Page 39 |
Page 40 |
Page 41 |
Page 42 |
Page 43 |
Page 44 |
Page 45 |
Page 46 |
Page 47 |
Page 48 |
Page 49 |
Page 50 |
Page 51 |
Page 52 |
Page 53 |
Page 54 |
Page 55 |
Page 56 |
Page 57 |
Page 58 |
Page 59 |
Page 60 |
Page 61 |
Page 62 |
Page 63 |
Page 64 |
Page 65 |
Page 66 |
Page 67 |
Page 68 |
Page 69 |
Page 70 |
Page 71 |
Page 72 |
Page 73 |
Page 74 |
Page 75 |
Page 76 |
Page 77 |
Page 78 |
Page 79 |
Page 80 |
Page 81 |
Page 82 |
Page 83 |
Page 84