ProductNews
Volpi Introduces LED Light Source: intraLED 3 Te success of an image processing application depends on the quality of the lighting system selected. Te most important factors are having both a luminous flux that is as high as possible and very good homogeneity values. To
comprehensively meet these requirements Volpi is introducing the intraLED 3 LED light source. Tis economical and compact lighting system has a service life of 50,000 hours and a light intensity of over 500 lumens.
VOLPI USA
www.volpiusa.com
Lens Positioning in 3D with Sub-Nanometer Precision
Mad City Labs, Inc. announces the introduction of the Nano-F3D lens nanopositioning system. Te Nano-F3D is designed to position an objec- tive lens in 3 dimensions with sub-nanometer accuracy and repeatability. With a travel range
of 100 μm in each axis, the Nano-F3D is suitable for 4Pi microscopy as well as other imaging and inspection applications. Te Nano-F3D features integrated PicoQ® sensors with closed loop control, giving the user picometer precision and ultra-high stability.
Mad City Labs, Inc.
www.madcitylabs.com
EDAX Introduces Team™ EDS 2.0 Analysis System
EDAX Inc. introduces the TEAMTM Energy Dispersive Spectroscopy (EDS) 2.0 Analysis System. Te TEAMTM EDS 2.0 Analysis System includes enhancements that stream- line analysis and reporting workflow, boost-
ing user productivity, reducing analysis time, and minimizing potential for errors. A new dynamic review feature allows users to easily compare and review multiple maps simultaneously. Analytical processing capabilities also have been improved with new Quant maps and a histogram tool to extract spectra from the area of interest.
EDAX, a division of AMETEK, Inc.
www.edax.com
Nikon Metrology, Inc. Introduces SMZ-745 Stereoscopic Microscope
Te airtight, anti-electrostatic, and anti-mold design of the microscope prevents samples from being damaged by electrostatic discharge, dust, and water. Te microscope is optimized with the Greenough optical system, allowing it to reach a zoom ratio up to 7.5 times. Te magnification ranges from 3.35× to 330× when combined with
the auxiliary objective lens and eyepiece. It also has a total reflection prism, which results in bright, high-contrast images with a working distance up to 115 millimeters.
Nikon Metrology, Inc.
www.nikonmetrology.com
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Carltex: Imaging Solutions for Every Application
Carltex is a leading North American distributor of measurement and control products. Carltex has been appointed the distributor for BestScope International
Ltd, a well-known and respected supplier in the field of microscopy and scientific instrumentation. BestScope microscopes and cameras provides the best price/feature ratio in the industry! Carltex now offers this diverse selection of products.
Carltex, Inc.
www.carltex.com
TILL Photonics’ iMIC 42 Offers a Four-Camera Solution Using Only Two Cameras
Te iMIC 42 has a dual-camera module that switches between TILL’s Andromeda spinning disk and the epi/TIRF optical path of the iMIC digital microscope in 300 ms with the help of a motorized slider. Te iMIC 42 also replaces the widefield bypass of other spinning disk units with
fast motorized filter wheels in front of the cameras that allow further selection of the emission light.
TILL Photonics
www.till-photonics.com/news
Wide-Area Illumination by LED
CoolLED has expanded its range of LED products by introducing a new unit that has been designed to create wide areas of intense flat and homogeneous light. Performance and intensity are achieved using the company’s cooled-array LED technology.
Typical applications range from UV curing for manufacturing processes to in-vivo illumination for the life sciences. With an incredibly long lifetime, LEDs save money and provide illumination that does not fade like a conventional lamp during its lifetime.
CoolLED Ltd.
www.CoolLED.com
JEOL JEM-2800 High-Throughput TEM
Te new JEOL JEM-2800 next-generation TEM achieves fast nano-area analysis through automation and high-speed specimen exchange. Tis easy-to-use, multi-purpose TEM performs high resolution TEM and STEM imaging, EDS, EELS, critical dimension, tomography, and in situ
observation without use of a fluorescent screen. A large solid angle EDS with SDD achieves superior analytical capability. Automatic adjustment of
an automated on-screen operating guide make the JEM-2800 a high-throughput, user-friendly TEM.
JEOL USA
www.jeolusa.com
doi:10.1017/S1551929511000599
www.microscopy-today.com • 2011 July focus, astigmatism, contrast, and brightness and
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