Test and Measurement
LB Enclosures Product Range
Manufacture and modification of electronic enclosures
E-Case Range
The E-Case range of closed box section extrusion Available in the online shop in 5 sizes Fits 55mm, 100mm or 160mm wide PCBs Supplied in pre-anodised Silver or Black and in a range of lengths
Combi-Case Range
Figure 5: Before vector calibration, the VNA measures everything beyond its ports, including cables and connec- tors. After calibration, the VNA moves the test reference plane to that of the DUT, correcting for all fi xtures.
However, modern communication standards require complex modulation of wideband signals. Conventionally, testing modulated wideband signal distortion measurements like EVM and ACPR required a signal analyser and signal generator setup. Switching between two separate test setups to complete characterisation not only wastes valuable test time, but also introduces difficulty in correlating results between the two stations. Furthermore, the external test fixtures needed to perform EVM measurements on a signal analyser, such as attenuators or booster amplifiers, present even more measurement uncertainty. To go from measuring the transmit path to the receive path, traditional set ups require engineers to fl ip the orientation of the device under test (DUT), re-connect, toggle to receive mode, and then recalibrate. From there, an engineer would either use the cold source noise fi gure method on a VNA setup or perform the Y-factor method on a signal analyser test set. The Y-factor method with the signal analyser would additionally require an external noise source to capture noise fi gure of the DUT.
How do telemetry advancements help simplify T/R module characterisation?
Considering the dual directionality and integration of T/R modules, performing accurate and repeatable characterisation while minimising test cycle time presented significant challenges in the past. Traditional test setup limitation made concurrent measurements incredibly difficult, time-consuming, and error prone. Greater hardware integrations on modern network analysers, like built- in upconverters and noise receivers on multiple ports, allow more flexibility in test setup for both the transmit and receive path. This flexibility makes the VNA setup orientation agnostic, allowing engineers to connect and calibrate the test
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set once and collect various transmit and receive mode measurements. Expanded software application features allow for spectrum and signal analysis directly on the network analyser, making fully vector corrected modulated signal EVM and ACPR measurements available on the same setup used for CW and two-tone testing. By applying vector and source calibration to the EVM measurement, the VNA delivers the lowest residual EVM by moving the reference plane to that of the DUT, as shown in Figure 5. This means that the network analyser removes all test system error contributions from the power amplifi er EVM results. The direct receiver access on modern network analysers enables even more test set fl exibility by allowing engineers to loop booster amplifi ers or directional couplers into the measurement while maintaining the quality of the incident modulated signal and the VNA calibration of the receivers.
Conclusion
Once a topology virtually exclusive to radar applications, advancements in component technologies made phased arrays feasible in the communications industry. Phased array functionality is dependent upon T/R module performance. In turn, T/R module operation depends most on the behaviour of the internal amplifi ers. However, amplifi ers prove the most diffi cult system components to fully characterise with traditional test sets. Modern network analysers provide the flexible hardware and advanced software capabilities needed to consolidate the test setup for robust characterisation of both the LNA and PA. Vector and source correction, along with integrated hardware and direct receiver access, all work together to create a single test set capable of executing accurate and repeatable CW, two-tone, and modulated signal measurements at the DUT’s reference plane.
https://www.keysight.com/us/en/
home.html Components in Electronics October 2024 21
The Combi-Case 100 Range of 2-part U section extrusion 2 height options - make 3 variants - 30mm / 44mm & 58mm To fit 100mm wide PCBs Supplied in pre-anodised Silver or Black
UnioBox & U-Case Range
UnioBox & U-Case range of 6 piece enclosure kits Consists of 2 side extrusions in 1U, 66mm, 2U and 3U heights Enclosures can be manufactured to different widths and lengths Available in a range of fixed sizes in silver
19” Rack Enclosures
A full range of 19” rack enclosures extruded and blanking panels 1U, 2U & 3U enclosures - 100mm / 150mm & 250mm deep
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