MICRO METROLOGY | CASE STUDY [ GBS SmartWLI ]
High-Speed Interferometry
3D Surface Measurements
White Light /Phase Shift Mode
Perfect for roughness and step height measurements
Nanometer accuracy
Automated report generation with MountainsMap technology
Motorized stage for large samples
Portable system for large or heavy samples
SmartWLI microscope 3D upgrade module for optical microscopes
We also supply
AFMs for research, industry and teaching Nano-/Micro- Indenter and Tribology Tester, Nanoparticle size measurement
Solid support ensures a successful result
Autocraſt was very satisfied with the support Mitutoyo provided for this turnkey installation. Michael concluded: “Naturally, with a large project such as this, difficulties were expected, but what small problems did arise were resolved quickly and handled on the spot by the relevant Mitutoyo engineer. Nothing was too much trouble. Mitutoyo delivered what we asked for and more — fast, accurate and reliable machines with excellent support and a total commitment to us as their customer. Mitutoyo’s drive, commitment and enthusiasm to work with and support Autocraſt was evident all the way from the MD through to technical support, service support and training.”
Contact your nearest office
Germany
info@schaefer-tec.com +49 6103 300 980
France
info@schaefer-tech.com +33 1 6449 6350
South-East
see@schaefer-tec.com Europe
+39 0425 27228
Switzerland
ch@schaefer-tec.com +41 34 423 7070
www.schaefer-tec.com 27 | commercial micro manufacturing international Vol 7 No.6
Page 1 |
Page 2 |
Page 3 |
Page 4 |
Page 5 |
Page 6 |
Page 7 |
Page 8 |
Page 9 |
Page 10 |
Page 11 |
Page 12 |
Page 13 |
Page 14 |
Page 15 |
Page 16 |
Page 17 |
Page 18 |
Page 19 |
Page 20 |
Page 21 |
Page 22 |
Page 23 |
Page 24 |
Page 25 |
Page 26 |
Page 27 |
Page 28 |
Page 29 |
Page 30 |
Page 31 |
Page 32 |
Page 33 |
Page 34 |
Page 35 |
Page 36 |
Page 37 |
Page 38 |
Page 39 |
Page 40 |
Page 41 |
Page 42 |
Page 43 |
Page 44 |
Page 45 |
Page 46 |
Page 47 |
Page 48 |
Page 49 |
Page 50 |
Page 51 |
Page 52