MICRO METROLOGY | ARTICLE


With 3D CLSM, image acquisition is rapid and also highly intuitive owing to the


dedicated software, even for students lacking microscopy experience.


<< Figure 3: Surface roughness evaluation of silver nanowire mesh electrodes using the Olympus LEXT OLS4100. Image stitching expands the field of view, facilitating analysis of nanowire distribution as a height colour plot in 2D (A) and 3D (B). Images courtesy of Dr M. Schiek, University of Oldenburg. >>


22 | commercial micro manufacturing international Vol 7 No.6


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