Product News JEOL Introduces New Best-in-Class Field Emission SEM
T e new JSM-7200F is an FE SEM with ultrahigh spatial resolution of 1.6 nm at 1.0 kV and high probe current of 300 nA. Featuring through-the- lens detectors that can collect a variety of signals by varying the built-in energy fi lter, the JSM-7200F produces a large amount of data in a very short amount of time. T e JSM-7200F is an all-in-one SEM designed for any type of sample or analysis, including magnetic samples, non-conducting
materials, biological specimens, and semiconductor devices.
JEOL USA, Inc.
www.jeolusa.com
Hitachi 200 Kv Aberration-Corrected TEM/STEM/SEM
Hitachi announced the all-new HF5000 electron microscope with three imaging modes, including TEM, STEM, and SEM. T e automatic probe-forming aberration corrector makes sub-Å resolution imaging routinely achievable. T e state-of-the-art cold fi eld-emission gun delivers high brightness, long-time probe current stability, and high-energy resolution. T e dual-SDD windowless detectors provide
the largest solid angle in the market for fast and high-sensitivity EDS analytical work. EELS and many other options are available.
Hitachi High Technologies America, Inc.
www.hitachi-hightech.com
Oxford Instruments Launches Revolutionary EDS Detector: X-Max Extreme
Oxford Instruments has launched X-Max Extreme, a Silicon Driſt Detector for ultrahigh resolution FEG and FIB-SEM applications. T is unique detector for the fi rst time enables EDS data collection at very low kV (for example, between 1 kV and 3 kV) and a very short working distance to provide elemental
analysis under the conditions used to analyze nano-materials and surfaces at the highest SEM resolution. For the fi rst time, EDS resolution approaches that of the SEM.
Oxford Instruments NanoAnalysis
http://oxford-instruments.com
The Leica DM2500 LED Microscope for Clinical Laboratories and Research Applications
T e Leica DM2500 LED is suitable for demanding tasks in clinical laboratories. T e ultra-bright LED illumination of the Leica DM2500 LED was developed in cooperation with pathologists and research scientists and off ers a constant color temperature at all light
intensities, enabling particularly fi ne diff erentiation of colors in stained specimens. T e LED illumination is also suitable for unstained or low-contrast specimens and high magnifi cations, for example, for light-intensive phase or diff erential interference contrast applications.
Leica Microsystems GmbH
www.leica-microsystems.com
46 Picoquant's LSM Upgrade Kit Supports the Zeiss LSM 880
T e new FLIM and FCS upgrade kit expands the capabilities of the Zeiss LSM 880 confocal laser scanning microscope with time-resolved analysis techniques such as fl uorescence lifetime imaging (FLIM),
fl uorescence correlation spectroscopy (FCS), or advanced time-resolved Förster resonance energy transfer (FRET) analysis. T e broad range of laser sources available, high photon sensitivity, and time resolutions ranging from pico- to microseconds make it possible to analyze all types of commonly used fl uorophores.
PicoQuant GmbH
www.picoquant.com
Long-Life Metal Halide Illumination System
T e Lumen 200S is a powerful 200 Watt, cost-eff ective alternative to standard 100 Watt mercury and halogen lamp houses traditionally used for fl uorescence imaging. T e built-in shutter of the Lumen 200S is able to close in 30 ms, allowing very brief exposure periods thereby minimizing the risks of photobleaching damage even to sensitive
samples. A wide variety of control options are available for the Lumen 200S including RS232, USB, TTL, and via the ProScan
® III controller.
Prior Scientifi c Instruments Ltd
www.prior-scientifi
c.co.uk
Bruker Introduces Opterra II Multipoint Scanning Confocal Microscope
Bruker announced the Opterra II™ Multipoint
Scanning Confocal Microscope. T e Opterra II’s low photo-toxicity and photo-bleaching capabilities deliver signifi cant advantages over today’s spinning disk confocal approaches, including enabling time-lapsed volumetric
studies on previously inaccessible specimens. T is performance is achieved through the system’s unique ability to optimize an experi- ment’s imaging conditions through real-time adjustment of imaging speed, resolution, and sensitivity. T e Opterra II provides sub-10% fi eld uniformity deviation, allowing quantitative analysis in all dimensions.
Bruker Nano Surfaces Division
www.bruker.com
STED FLIM Microscopy
Abberior Instruments launches STED FLIM, with the following features: 1) Acquire simultaneously FLIM data in up to 4 channels. 2) Online calculation and display of lifetimes in STED mode. 3) Separate dyes in STED mode via their lifetimes. 4) FCS, scanning FCS, and other single-molecule spectroscopy through offl ine analysis. 5) Auto-saving
of TCSPC photon streams that can be directly loaded into MATLAB, Python, C/C++, and ImageJ. 5) Perform an easy workfl ow based on a full soſt ware integration of STED FLIM into Imspector.
Abberior Instruments GmbH
www.abberior-instruments.com
doi: 10.1017/S1551929515000887
www.microscopy-today.com • 2015 November
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