Expand Your Boundaries Discover the Nano-World with the Hitachi AFM5300E
Vacuum System
• High-resolution observation of electromagnetic properties • High temperature and cryogenic measurements
In-situ Observation
• In air or in solution • Humidity control • Temperature control
Air Protection • SEM and ion milling compatible sample holder
Environmental-Control Atomic Force Microscope AFM5300E Inspire Innovation through Collaboration Hitachi High Technologies America, Inc.
www.hitachi-hightech.com Tel. 800-548-9001 Copyright © 2015 Hitachi High Technologies America, Inc. All rights reserved.
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