Product News Zeiss Xradia Ultra Load Stage
Xradia Ultra Load Stage uniquely enables in situ nanomechanical testing—compression, tension, indentation—with non-destructive 3D imaging. Study the evolution of interior structures in 3D, under load, down to 50 nm resolution. Understand how deformation events and failure relate to local nanoscale
features. T e Xradia Ultra Load Stage explores a new critical length scale for in situ materials characterization, enabling researchers to observe internal features such as nanoscale cracks and voids at the macroscale.
Zeiss Xradia
www.zeiss.com/xrm
Lumen 1600-LED Fluorescence Illumination System
T e Lumen 1600-LED off ers individual control for 16 selectable wavelengths. With its unique 16 selectable LED wavelengths, the Lumen 1600-LED is compatible with all simple and multiband fi lter sets. For the user who wants ease of use, the Lumen 1600-LED has a “white light” mode with simple on/off and intensity buttons. Fitting directly to most microscopes, the system enables for rapid switching between
LED wavelengths to allow for capture of high-speed events.
Prior Scientifi c
www.prior-us.com/Products
Circular Polarization Spectroscopy of Microscopic Samples
CRAIC Technologies announced the addition of circular polarization spectroscopy capabilities to CRAIC microspectrophotometers with the microspectra
measure the circular polarization spectra in either ™ feature. It allows the user to
transmission or refl ectance modes. T e ability to measure circular polarization represents a powerful new tool for both materials science and biological research. CRAIC Technology’s circular polarization package consists of optics and hardware designed to be added to CRAIC Technologies’ microspectrophotometers in both transmission and incident illumination modes.
CRAIC Technologies, Inc.
www.microspectra.com
Leica Microsystems Launches Inverted Microscope
Leica Microsystems introduced the modular Leica DMi8 inverted microscope platform for industrial applications. T e Leica DMi8 makes it possible for users to confi gure a basic microscope system now and upgrade later as needs and applications change. In addition, users can speed up their workfl ow, because working with an inverted microscope makes sample placement and change between
samples faster than in upright microscopy. Additionally, the Leica Application Suite soſt ware guides users through the analysis step by step.
Leica Microsystem
www.leica-microsystems.com
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Leica Microsystems Combines Cryo Fixation, Fluorescence Light Microscopy, and Electron Microscopy in One System
Leica Microsystems launched Leica EM Cryo CLEM. In CLEM, the sample is studied under the fl uorescence light microscope and the electron microscope. T e image data from both sources can be combined. T e Leica EM
Cryo CLEM system consists of a fl uorescence light microscope with cryo stage, cryo objective, and a cyro transfer shuttle. It keeps cryo- fi xed samples under cyro conditions during imaging and during transfer.
Leica Microsystem
www.leica-microsystems.com
Olympus CX23 Microscope Offers Ruggedness, Dependability, and Optical Excellence for Education, Training, and Laboratory Use
Like other instruments in the Olympus CX series, the new microscope features high-performance infi nity-corrected optics for bright, clear, crisp images. T e stable, color-corrected LED light source delivers reliable, natural-looking illumi- nation, using far less power and lasting many times longer than traditional bulbs. A fi eld number of 20 provides for added effi ciency. T e user can lock the frame to prevent the objective and glass slide from coming in contact.
Olympus Corporation
www.olympusamerica.com
4-channel CoaXPress Interface Enables 5-megapixel JAI Camera to Run at 253 fps
JAI has added a 4-channel CoaXPress interface to its 5-megapixel SP-5000 camera enabling the camera’s high performance CMOS imager to run at its maximum full frame rate of 253.8 frames per second for 8-bit, 10-bit, or 12-bit pixel formats. Two models are available, the SP-5000M- CXP4 (monochrome) and SP-5000C-CXP4
(color). Both models feature a 2560×2048 pixel CMOS imager available exclusively from JAI.
JAI Inc.
www.jai.com
New AFM with High-Defi nition Electrical Measurement Capabilities
Nanoscience Instruments introduced the Nano-Observer AFM. T is high-defi nition single-pass Kelvin Probe Force Microscopy (KFM) provides high-resolution surface potential mapping. T e ResiScope, an award- winning innovative module, can be combined with the Nano-Observer to measure resistance over 10 orders of magnitude using atomic force microscopy. Resistance measurements can be coupled with magnetic force microscopy, electric force microscopy, or single-pass KFM imaging modes to acquire multiple properties in the same scan area.
Nanoscience Instruments
www.nanoscience.com
doi: 10.1017/S1551929515000486
www.microscopy-today.com • 2015 July
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