EELS and EDS Analysis


[10] J Scott et al ., Ultramicroscopy 108 ( 2008 ) 1586 – 94 . [11] P Longo et al ., Microsc Microanal 20 ( 2014 ) 779 – 83 .


[12] A Pakzad . Gatan Inc., "Argon Ion Polishing of Focused Ion Beam Specimens in PIPS II System," Application note, 2014, http://info.gatan.com/acton/attachment /11413/f-0122/1/-/-/-/-/AppNote%20PIPS%20II%20 Argon%20Ion%20Polishing%20FL1.pdf .


[13] S Lazar et al ., Microsc Microanal 16 ( 2010 ) 416 – 24 . [14] K Riegler and G Kothleitner , Ultramicroscopy 110 ( 2010 ) 1004 – 13 .


[15] P Longo . Gatan Inc., Application Note, 2011, “T e use of MLLS fi tting approach to resolve overlapping edges in the EELS spectrum at the atomic level,” http://info. gatan.com/acton/attachment/11413/f-01a1/1/-/-/-/-/ Use_of_MLLS_fi tting_EELS_FL1.pdf .


[16] E Lifshin . Proc 9 th Ann Conf Microbeam Anal Soc , Ottawa, Canada, 1974, paper no. 53.


[17] R Van Grieken and A Markowicz , Handbook of X-ray Spectrometry . Marcel Dekker, Inc. , New York , 2001 .


[18] GA Botton et al ., Ultramicroscopy 110 ( 2010 ) 926 – 34 .


[19] RF Egerton , Electron Energy-Loss Spectroscopy in the Electron Microscope , 2nd Edition , Plenum Press , New York , 1996 .


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