Test & Measurement I Product News
Enhancements to CodeSonar Visualisation simplifies defect detection
GrammaTech, a specialist manufacturer of software-analysis tools, has announced a number of enhancements to its CodeSonar’s software architecture visualisation features. These include a new treemap view designed to allow users to see the hierarchical structure of the code in a very information-dense form. The view uses colorization to show the density of defects in modules so users can identify problematic parts of the code.
The call graph is organised by module structure, so users can drill down to see a greater level of detail, choose different layouts such as treemap, circuit, cluster, flow, radial and other layouts, and attach persistent notes to the diagram. Transitions such as zooming or layout changes are fluid and real-time.
“The visualisation capabilities of CodeSonar will allow developers to gain an understanding of very large code bases and potential vulnerabilities,” said Paul Anderson, vice president of Engineering at GrammaTech. “It scales to tens of millions of lines of code and is designed to show what is appropriate for the current level of abstraction.”
Using CodeSonar visualisation engineers can start at individual functions to gain insight from a bottom-up perspective, annotate nodes and edges with additional information and, overlay the visualisation with information on defects and
source-code metrics. CodeSonar visualisation also includes other programme-understanding and navigation features, and supports sharing of diagrams between team members. Other features allow users to search the graph for functions of interest, and navigate to and from the source code of the programme. In addition, the architecture is extensible, so users can generate graphs from other sources, feed them in an XML format to the tool, and see them in the same user interface. CodeSonar visualisation works in standard web clients. CodeSonar has long been used by embedded developers working on mission-critical applications such as satellites, avionics, industrial controls and medical devices.
Grammatik |
www.grammatech.com
Variable-wavelength modules for optical test system from Yokogawa
Yokogawa has extended the range of plug-in modules for use with its AQ2200 Series multi-application optical test system by introducing two new tunable light source modules that allow the test wavelength to be varied to suit the user’s application. The new AQ2200-131 (one channel) and AQ2200-132 (two channels) enables the user to tune the test wavelength to one of the preset DWDM (dense waveform division multiplexing) grid wavelengths. As a result, engineers will only require one module to cover a variety of test requirements, providing economies in cost, space and lead time. Target applications include the testing of optical fibre amplifiers and digital coherent systems, especially those involving DFB (distributed feedback) laser diodes. Two versions of each module are available for
different applications. The standard type, targeted at optical fibre amplifier testing, is tunable to one of the 100, 50 or 25 GHz grids, and offers a line width of 3 MHz. The advanced type, aimed at digital coherent system testing, is tunable to an arbitrary grid frequency with 100 MHz minimum steps, and has a narrow line width of 100 kHz plus SBS (stimulated Brouillon scattering) suppression. The Yokogawa AQ2200 multi-application test system is a modular platform that offers a solution for many optical test applications. With
Teledyne LeCroy debuts new optical modulation analyzer solution
Teledyne LeCroy, in conjunction with Coherent Solutions, has developed a 45 GHz Optical Modulation Analyzer — said to offer the highest real-time bandwidth available in the market. The system is capable of testing DP-QPSK and DP-16- QAM optical signals at speeds up to 85 GBaud. Field trials are due to begin shortly. The Optical Modulation Analyzer (OMA) consists of an IQ-RT45 Coherent Optical Receiver rated to 45 GHz and developed by Coherent Solutions, a LabMaster 10 Zi oscilloscope with available bandwidths up to 65 GHz, and proprietary Optical Modulation Analysis software. These OMAs provide a dynamic calibration capability to enable the LabMaster 10 Zi real-time oscilloscope to be disconnected from the IQ- RT45 Coherent Optical Receiver and used for other electrical validation and testing without requiring a factory re-calibration. This enables dual use of the oscilloscope for serial data eye diagram, jitter, noise and crosstalk analysis on NRZ electrical tributaries using Teledyne LeCroy’s SDAIII-CompleteLinQ software package. “The LabMaster 10 Zi real-time oscilloscopes support bandwidths up to 65 GHz and our proprietary ChannelSync architecture. This system provides the ideal platform for optical communications signal analysis” states Ken
Agilent Technologies unveils bit error ratio tester
Agilent Technologies has unveiled a 32-Gb/s bit error ratio tester with four-tap de-emphasis. According to the company it comes in response to a new era of data-centre infrastructure that enables cloud computing, big data and analysis which is driving the development of new high- speed data transfer standards such as 100-Gb Ethernet and 32-Gb Fibre Channel. The higher speeds create new testing challenges for designers of servers, network interface cards, backplanes and communication ICs. That’s because quality degrades when signals are transmitted over backplanes, printed circuit board traces and long cables. To address the issue, Agilent has created
Johnson, Director of Marketing at Teledyne LeCroy. “ChannelSync provides superior channel- to-channel phase accuracy at the highest bandwidths. The seamless integration of Coherent Solutions’ leading-edge coherent optical receiver with the LabMaster 10 Zi oscilloscopes delivers an OMA system that sets a new standard for capability and ease-of-use.”
Teledyne Leroy |
www.teledynelecroy.com
remotely mountable pattern-generator heads for use with its N4960A BERTs (bit error ratio testers). The new pattern-generator heads (N4951B Option D32 and Option D17) feature integrated four-tap de-emphasis (one pre-cursor, two post-cursors) operating up to 32 Gb/s, which provides designers with the signal compensation required for transmitter emulation when they characterise receivers and systems. In addition, the N4980A multi-instrument BERT software will allow engineers to directly
Tektronix launches next generation high performance AWG series
Tektronix has unveiled its next generation of arbitrary waveform generators that offer up to 50 GS/s sample rate performance. The new AWG70000 series is able to combine high sample rate with a long waveform memory and deep dynamic range, and as a result is able to support a wide range of signal generation requirements in defence electronics, high- speed serial, optical networking and advanced research applications.
As data rates and signal complexity continue to increase
across all electronics and RF segments, engineers and researchers need more advanced signal generators to fully stress test designs and to perform research. As a result the AWG70000 Series provides a 50 GS/s sample rate performance,
12 April 2013 Components in Electronics
16 GS of waveform memory, and 10 bit vertical resolution . This means it produces fast, clean signals that can be routed through
a receiver or other device under test for long periods of time for truly comprehensive testing. “The AWG70000 series represents a significant advance for customers who are pushing against today’s performance boundaries and need a more powerful way to generate accurate test signals at high sample rates,” said Jim McGillivary, general manager of the Source Analyzer Product Line, Tektronix. The AWG70000 Series gives design engineers and researchers the ability to create, generate or replicate ideal, distorted or “real-life” signals, an essential step in the design and measurement process.
Tektronix |
www.tektronix.com www.cieonline.co.uk
compute de-emphasis tap weights from the frequency response (s-parameters) of their signal paths. Designers can easily optimise tap weights in the tool and programme them directly into the pattern generator head when they are ready. “We are the first in the industry to provide de-emphasis functionality operating up to 32 Gb/s,” said Juergen Beck, vice president and general manager of Agilent’s Digital Photonics Test Division. “With this capability added to the N4960A serial BERT family, high-speed backplane and communication IC designers now have the signal fidelity and signal compensation tools they need to test their next-generation devices.” As part of the N4960A BERT family, the new
pattern generators are configured as remote heads connected to the BERT controller with a one-meter control cable. This configuration allows the pattern generator to be located close to the device under test, minimising the length of the signal cable, which helps minimise signal degradation.
Agilent Technologies |
www.agilent.com
its broad range of available plug-in modules, it simplifies complex measurement setups with a single-box solution. A single system can handle multiple applications simultaneously, allowing different users to control the modules with resulting cost savings. The fast response of the instrument makes it an ideal tool in the manufacturing environment.
The system is available with 3- and 9-slot frames which allow “hot swapping” of modules, and combines fast command processing and programmeming capabilities with Ethernet, GP-IB and USB interfaces. The broad range of available modules includes units for optical power sensing and measurement, light sources, optical attenuators, optical switches, and optical transceiver testers.
Yokogawa |
www.tmi.yokogawa.com
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