PRODUCT: UPDATE


CompoundTek, Cadence and Lumerical to deliver integrated electronic-photonic design kit www.compoundtek.com


Global foundry firm CompoundTek has collaborated with Cadence Design Systems and Lumerical to deliver a CompoundTek process design kit (PDK) for silicon photonics ICs. Te kit consists of a new,


advanced electronic-photonic design automation (EPDA) flow with features aimed at further advancing the development of differentiated solutions. Te PDK is based on the


Cadence Virtuoso custom IC design platorm, utilising the CurvyCore engine, Cadence


Spectre simulation platorm and the electrical-optical co-simulation capability in Lumerical’s photonic integrated circuit simulator Interconnect. It includes active and passive


devices such as optical waveguide devices, fibre-to-waveguide couplers, high-speed waveguide Ge photo-detectors and high- speed modulators to enable silicon photonics designers to design and verify their photonics products more quickly and efficiently, before fabricating physical prototypes.


CommScope FACT offers versatile ODF solution


www.commscope.com


Te advanced interferometer measures and inspects fibre end- faces with cladding diameters between 125 to 720μm, and is specifically designed for production lines where a fast, but very accurate end-face inspection is required. It is also suited for research and development environments, and fibre cleaver maintenance purposes. Te ProView LD provides a 2D and 3D topographic analysis of


FACT, from CommScope, is a versatile, end-to-end, fully front accessible ODF solution that incorporates termination, splicing and storage demands. Te tool-less system approach


and the high level of modularity guarantee an easy migration path towards new connectivity platorms and expansion of existing central offices and data centres. It enables high-density,


manageable, future-ready deployments in 30 per cent less space using compact, lightweight and robust building blocks. Te tool-less design allows for rapid network deployments and reduced costs. As it is fibre and cable technology independent, it also increases design flexibility.


38 FiBRE SYSTEMS n Issue 26 n Winter 2020


the end face surface. Te soſtware automatically indicates the angle, flatness and slope direction of the end-face. In addition to cleave angle inspection, the system can also be used to measure several other properties, such as fibre diameters and distance between defined points. Te unit has a unique fibre


clamping mechanism which can accommodate standard fibre


Laser Components launches ProView LD for inspection and measurement


www.lasercomponents.com


holders from Fitel or Fujikura, but also allows the use of bare fibres. Te interferometer has a compact design, it is connected and powered via a USB 3.0 cable and hosted by an external PC (not included).


Sumix launches inspection probe for Huber+Suhner connectors www.sumix.com


Sumix Corporation has introduced Huber+Suhner’s ODC and Q-ODC inspection tips for the Sumix Manta-W+ fibre microscope. Te Manta-W+ is capable of


inspecting six rows of 12 or 16 fibre terminations of an MPO connector in a single scan. Along with multi-fibre push on connections, the microscope also supports all standard connector types, including LC, SC, SMA, E2000, AVIM, Mini-AVIM, and many more, both patch cord and bulkhead side, with an extensive selection of interchangeable tips available.


Te Huber+Suhner Q-ODC


and ODC outdoor connectors are waterproof, dust proof, corrosion resistant and RoHs compliant, to enable reliable connection in harsh environments. Sumix has developed adapters for both plug and socket (male and female) sides of ODC-2, ODC-4, Q-ODC-2 and Q-ODC-12 type connectors. Adapters are compatible with Manta-W+ and Manta+ microscope probes. Huber+Suhner has also introduced


Sumix test solutions for its own laboratory and field inspection needs.


www.fibre-systems.com @fibresystemsmag


Tese new adapter tips are additionally available for any companies implanting equipment with the new Huber+Suhner interfaces.


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