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COMMENT


• Medical devices such as glucose metres, blood pressure monitors and pulse oximeters


• IoT devices, including smart speakers, smart door locks and home security systems


• Mobile devices such as smartphones, wearables and tablets


Panelising PCBs not only assists smaller boards in conforming to standard production procedures, but also enhances  PCB panelisation include saving time and  


How does parallel panel testing 


A parallel test method enables testing  approach of parallel panel testing facilitates in-circuit tests to meet high-volume production demands effectively (Table 1 For example, if a single board takes six seconds to test, meeting the high-volume production demands necessitates a throughput of four boards every six seconds,    necessary throughput, the manufacturer faces two options:


Purchase four testers, which would demand  Invest in a single tester capable of testing all four boards in parallel


Testing four boards sequentially using one tester would require four times the single-  testing four boards in parallel reduces the overall test time to approximately six  savings of 10 seconds over the testing of four 


  


 requires a test system that can conduct ICT,   Massively parallel board testing can test multiple boards at the same time using 


In traditional setups, in-circuit testers typically limit testing to up to four boards   and throughput are paramount, the demand rises for the ability to test a larger quantity of 


Table 2. PCBA test time for sequential versus parallel test


capable of testing 10 to 20 boards in parallel 


Given their simpler and smaller board designs, low-complexity products can accommodate 20 boards on a single  capable of massively parallel testing are with test cores to execute tests for all boards in  





In response to this shifting landscape,  themselves at the nexus of a transformative  to produce electronics at a lower cost and achieve  


Furthermore, massively parallel testing can lead to an increase in the density of panel   Consequently, there is a reduction in the    Overall, massively parallel testing provides advantages over standard parallel testing, especially in the realm of high-volume  Table 2 shows the benchmark conducted on individual boards, panels of four and





panels of six, demonstrating that throughput increases as the number of units on a panel  to the simultaneous testing of multiple units,  In contrast, sequential testing, which evaluates one unit at a time, inherently operates at a slower pace due to the   leads to bottlenecks within the testing process, consequently impeding the overall  parallel testing, where we assess multiple units simultaneously, we reduce the time    





To optimise the testing process for high- volume, low-complexity manufacturing of PCBs, a panelisation technique is employed  facilitates the integration of smaller, less intricate boards into manageable panel sizes, enhancing cost-effectiveness while notably  the implementation of massively parallel testing allows operators to simultaneously test multiple boards, ensuring swift test throughput, streamlined functional test measurements and a cost-effective approach to overcoming the challenges associated with high-volume manufacturing  testing emerges as the quintessential solution for high-volume board test production environments, delivering prompt 


MARCH 2026 | ELECTRONICS FOR ENGINEERS 9 Test method


Sequential testing Parallel testing


Single board test time Number of boards Total test time 6 seconds 6 seconds


20 20


Table 1. Sequential versus parallel test time


120 seconds 30 seconds


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