Test & measurement


FORMING THE ANSWER TO TEST EFFICIENCY


By Gabriel Sikorjak, strategic marketing manager - High frequency domain, OMRON Electronic Components Europe


ohmic resistance. However, the mechanism adds complexity to the design and seizing or other malfunctions are possible as the DUT is placed on the test fixture. The pin can break or the spring may fail if positioning error or force is excessive. Further reducing the mechanism size, to permit closer positioning needed to test densely populated boards, results in the pin being more fragile and more easily broken.


Creating an alternative that overcomes these limitations while also supporting the drive towards smaller geometries is not easy or trivial. A suitable pin must provide adequate compliance to let the pin find its place against the test point as well as ensuring adequate and consistent contact force. At the same time, durability needs to be improved to minimise stoppages to replace broken pins and prevent false NG results that can result from poor electrical contact and inconsistent contact resistance.


Figure 2: Connectors designed with vibration resistance are challenging for inspection Instrumentation Monthly January 2026


A new type of test pin made with a specially developed electroformed (EFC) metal alloy and fabrication process now presents a solution to meet these demands. The custom material provides mechanical properties comparable to 304-grade stainless steel (SUS304/SS304) and


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