Test & measurement Y
AQ2300 SERIES MODULAR HIGH-PRECISION SMU TO EXPEDITE THE DEVELOPMENT OF SEMICONDUCTOR DEVICES
okogawa Test & Measurement Corporation announces the release of its AQ2300 series high-perfor- mance, high-speed SMU (Source Measure Unit) into the European marketplace. Addressing various
density needs for semiconductor/communica- tion devices, the AQ2300 series modular SMU offers high-quality pulse generation alongside high-precision voltage/current generation and measurements. Thanks to its inherent productivity and expandability characteristics, the 2-channel SMU module also saves time and space when performing the typically complex measurement functions essential for semiconductor devices.
DEVELOPMENT BACKGROUND The proliferation of smartphones and tablets, the rise of AI, and the expansion of autonomous vehicles is increasing the need for communication infrastruc- ture to enhance speeds and address future power demands. For laser devices in particular, engineers must undertake accurate sourcing of the mainly current signals that optimize laser control, adjusting the inputs accordingly to measure the precise output of laser light. Yokogawa there- fore set about developing its new AQ2300 series SMU with high levels of precision, functionality and modularity to keep pace with the minia- turization of next-generation devices and the increasing complexity of measurements required for R&D evaluation.
MAIN FEATURES The highly modular
AQ2300-Series SMU allows users to select the number of channels required (up to 18) to meet system needs within a limited space, supporting effi- cient facility operation. High-quality pulse wave- form generation (50 µs-width) is also an important feature.
44
This function suppresses the heat generated by the device during testing, making more accurate measurements possible. The rise and fall times may be disturbed due to the device or wiring, but by adjusting the parameter settings, a smooth output waveform can be achieved.
Interoperability is a further feature of note. AQ2300 series SMUs have trigger ports not only on the frame side, but also on each SMU channel. Moreover, in-frame synchronization functionality allows flexible selection of the connection method. In total, three trigger synchronization functions are available:
Synchronization of frames with external equipment
Synchronization of SMU channel with external equipment
Synchronization between SMU channels.
The frame can also feature a digital I/O inter- face that enables co-operation with external devices. Frames are available in 3-slot or 9-slot types and suit flexible adaptation to small and medium-sized measurement systems. Importantly, the AQ2300 series SMU provides flexible measurement timing control in support of better overall system performance.
Regarding productivity, the AQ2300 series offers the ability to perform simultaneous measurements of voltage and current. Further- more, by accelerating communication within the frame and between a PC, the new SMU fosters elevated levels of work efficiency, where high-speed data transfer reduces the total measurement time and significantly enhances operational efficiency.
Yokogawa Test & Measurement
tmi.yokogawa.com
January 2025 Instrumentation Monthly
Page 1 |
Page 2 |
Page 3 |
Page 4 |
Page 5 |
Page 6 |
Page 7 |
Page 8 |
Page 9 |
Page 10 |
Page 11 |
Page 12 |
Page 13 |
Page 14 |
Page 15 |
Page 16 |
Page 17 |
Page 18 |
Page 19 |
Page 20 |
Page 21 |
Page 22 |
Page 23 |
Page 24 |
Page 25 |
Page 26 |
Page 27 |
Page 28 |
Page 29 |
Page 30 |
Page 31 |
Page 32 |
Page 33 |
Page 34 |
Page 35 |
Page 36 |
Page 37 |
Page 38 |
Page 39 |
Page 40 |
Page 41 |
Page 42 |
Page 43 |
Page 44 |
Page 45 |
Page 46 |
Page 47 |
Page 48 |
Page 49 |
Page 50 |
Page 51 |
Page 52 |
Page 53 |
Page 54 |
Page 55 |
Page 56 |
Page 57 |
Page 58 |
Page 59 |
Page 60 |
Page 61 |
Page 62 |
Page 63 |
Page 64 |
Page 65 |
Page 66 |
Page 67 |
Page 68 |
Page 69 |
Page 70 |
Page 71 |
Page 72 |
Page 73 |
Page 74 |
Page 75 |
Page 76 |
Page 77 |
Page 78 |
Page 79 |
Page 80 |
Page 81 |
Page 82 |
Page 83 |
Page 84 |
Page 85 |
Page 86 |
Page 87 |
Page 88 |
Page 89 |
Page 90 |
Page 91 |
Page 92 |
Page 93 |
Page 94 |
Page 95 |
Page 96