• • • TEST & MEASUREMENT • • •
Anritsu announces a new uplink interference measurement to identify interference in 5G and LTE TDD networks
Anritsu has announced enhanced functionality to the Field Master spectrum analyser LTE and 5G measurement options
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s the rollout and densification of 5G networks accelerates, degradation of network performance resulting from
interference in the TDD uplink is becoming more prominent. The latest Field Master software release provides a dual display of the LTE or 5G Frame structure with automatic placement of gates on the Uplink slots alongside the RF spectrum of the gated time slots. For 5G networks with a coastal or mountainous
terrain, RF downlink transmissions readily become subject to atmospheric tropospheric ducting. Signals can travel hundreds of kilometres, resulting in a time offset relative to the far-end base station. The result is downlink power masking the uplink signals from user equipment. It is also essential that there is a common frame slot format deployed on all operator networks in a country, and ideally at international borders. The new uplink interference measurement includes configurations for the common frame slot
formats recommended by international standards organisations, including GSMA, ITU-R, and ECC/CEPT. Anritsu’s Field Master spectrum analyser with LTE and 5G measurement options are the preferred test instrument for regulators and operators globally. The addition of this uplink interference measurement enhances its value by providing detailed insights into the common causes of interference in new TDD networks. 5G and LTE measurements are options for the Field Master Pro MS2090A covering FR1 and FR2 frequency bands and the new Field Master MS2080A for FR1 only networks. In addition to 5G and LTE measurements, a Real Time Spectrum
Analyser captures the detailed transmitter spectrum, and a cable and antenna analyser accessory facilitates sweeping of feeder cables.
New SOLID-BOX joins OKW’s measurement enclosures range
OKW has added tough new SOLID-BOX to its range of plastic enclosures for test and measurement electronics
OLID-BOX (IP 66, IP 67) has IK 08 impact protection, making it ideal for devices used in challenging industrial and outdoor environments. The enclosures are also well suited to plant/machine construction, HVAC, IoT/IIoT, Industry 4.0, gateways, data loggers, ICT, electrical installations, agriculture and safety engineering. These smart, highly polished enclosures can be installed ‘lid closed’ – ensuring any finely calibrated electronics inside remain accurate. The lid is recessed for a membrane keypad, while the bottom has deep recesses to protect connectors. SOLID-BOX is available in three sizes: 115 (135 x 115 x 50 mm), 145 (180 x 145 x 60 mm) and 175 (225 x 175 x 70 mm). Mounting points on the rear of sizes 145 and 175 match the hole patterns of VESA MIS-D 75/100. All the enclosures are moulded from tough PC+ABS (UL 94 V-0) in anthracite grey (RAL 7016) or light grey (RAL 7035) as standard.
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Accessories include lid retainers, internal hinges, non-slip feet, Torx screwdrivers and self-tapping screws (for PCBs or DIN rails).
Cable glands (M12 to M20) and bushings are also available.
Other enclosures in OKW’s test and measurement range include handheld DATEC- COMPACT for multimeter-type devices, PROTEC for table-top calibration units, and MINI-DATA-BOX sensor housings that can be cable-tied or screwed in place quickly and easily. All OKW enclosures for test and measurement are designed to safeguard sensitive electronics – enhancing accuracy and extending device longevity. They also feature attractive, modern aesthetics to reflect the high value of the technology they house. OKW can supply its enclosures fully customised.
Services include CNC machining, lacquering, printing, laser marking, decor foils, special materials, EMC shielding and installation/assembly of accessories.
28 ELECTRICAL ENGINEERING • OCTOBER 2023
electricalengineeringmagazine.co.uk
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