EQUIPMENT | MATERIALS TESTING
Right: The Nexsa surface analysis system is designed to be a cost-effec- tive, research- level x-ray photoelectron spectroscopy (XPS) option
The Epsilon 4 is a high-performance benchtop analytical tool for the determi-
Offering sharper and faster particle size and shape measurement, the instruments add value to product development, troubleshooting and quality control, particularly in analytical environments where a deeper understanding of a process and/or sample is required.
Particle characterisation The Morphologi 4 is a fully automated system for characterising particles ranging in size from less than one micron up to a millimetre and beyond. Compared to its predecessor, it offers quicker measurement – a time saving of around 25% – while delivering simpler, more intuitive method development and greater particle definition. A key feature is Sharp Edge, a new automated segmenta- tion/thresholding algorithm that makes it easier to detect and define particles. Measurement sensitiv- ity is further boosted by the 18 MP camera and by enclosure of the sample during imaging. The Morphologi 4-ID delivers Morphologically-
Directed Raman Spectroscopy (MDRS), integrating the static imaging capabilities of the Morphologi 4 with Raman spectroscopy to enable the compo- nent-specific morphological characterisation of different chemical species in a blend. Offering significantly faster spectral acquisition times than the previous model – a time reduction of up to 80% – it also allows acquisition conditions to be custom- ised to the sample. This enhanced control, com- bined with an extended spectral range, maximises the range of materials that can be identified and/or differentiated within a mixture. The instrument is fully automated and is designed to allow both particle characterisation scientists with limited spectroscopy experience, and more experienced spectroscopists to gain an in-depth understanding of their particulate samples.
78 COMPOUNDING WORLD | April 2018
nation of the chemical composition of all kinds of material. A multi-functional instru- ment, the Epsilon 4 is claimed to combine the latest advances in excitation and detection technology with mature software and a smart design. The analytical perfor- mance of the new benchtop instrument approaches that of more powerful and floor-standing XRF spectrometers. Due to its low infrastructural requirements, Epsilon 4 can be placed next to the production line while its high performance enables most applications to be operated at ambient conditions, reducing costs for helium or vacuum maintenance. The company says that the low-drift metal-ceramic X-ray tube delivers compli- ant results for years without the need for costly re-calibration. The instrument can automatically process sample batches without the need for operator attention. Malvern Panalytical has also introduced the
Claisse LeDoser-12 automatic dispensing balance for sample preparation by fusion for XRF and ICP analysis. The instrument can automatically weigh the sample and dispense flux with high precision. The automatic dispensing balance has three weighing modes that fulfil all needs in the labora- tory (sample-to-flux ratio, catch weight and absolute weight). The system is LIMS ready and can be plugged to a barcode reader. It ensures great connectivity and sample traceability, as well as an easy data transfer. This is key to avoiding sample misidentification and inversion, and it plays an important role in maintaining good productivity.
Surface analysis Thermo Scientific has developed the Nexsa surface analysis system for cost-effective, research- level x-ray photoelectron spectroscopy (XPS) studies. The system is designed to easily integrate multiple analytical techniques in a single compact, fully-automated surface analysis instrument. The company says that the Nexsa system combines the high throughput and high sensitivity of the Thermo Scientific K-Alpha+
XPS system with the multi-tech-
nique capabilities of the Thermo Scientific ESCAL- AB Xi+
XPS microprobe. Users of the Nexsa system can add complementary techniques, such as Raman spectroscopy, ion scattering spectroscopy (ISS), reflected electron energy loss spectroscopy (REELS) and UV photoelectron spectroscopy (UPS), to generate multiple measurements from the same point on the sample, without repositioning.
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PHOTO: THERMO SCIENTIFIC
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