June 3-8, 2018
Lehigh University, Bethlehem, PA USA MAIN COURSES
SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS June 4-8
SPECIALIZED COURSES
FOCUSED ION BEAM (FIB): Instrumentation and Applications June 4-8
PROBLEM SOLVING: Interpretation and Analysis of SEM/EDS/EBSD Data June 4-8
QUANTITATIVE X-RAY MICROANALYSIS:
Problem Solving using EDS and WDS Techniques June 4-8
SCANNING TRANSMISSION ELECTRON MICROSCOPY: From Fundamentals to Advanced Applications June 4-8
For more information, contact: Sharon Coe | 610.758.5133 |
sharon.coe@
lehigh.edu
Register and pay in full by April 13 to receive an early bird discount.
www.lehigh.edu/microscopy 48 YEARS OF EXCELLENCE
INTRODUCTION TO SEM AND EDS FOR THE NEW OPERATOR June 3
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