MSA Focused Interest Groups: Atom Probe Field Ion Microscopy and Focused Ion Beam Microscopy
Katherine Jungjohann,1 * Daniel Perea,2
1National Renewable Energy Laboratory 2Pacific Northwest National Laboratory 3Sandia National Laboratories 4Colorado School of Mines 5Termo Fisher Scientific
*
katherine.jungjohann@nrel.gov In 2002, the Microscopy Society of America (MSA)
launched a new initiative: Focused Interest Groups (FIGs). Te FIGs were designed to promote the science of microscopy and microanalysis, increase participation at the annual Micros- copy and Microanalysis (M&M) meeting, enhance collabora- tion and idea-sharing between microscopy and microanalysis disciplines, and increase interactions between microscopists at all career stages. In the last 20 years, several FIGs have exceeded this initial charter by formulating shared databases, developing important field standards, hosting external work- shops and tutorials, and organizing Pre-Meeting Congresses (PMCs), Sunday Short Courses, Symposia, and social events at the annual M&M meeting. Because these FIGs have proven to be powerful networking resources and helpful career accel- erators, this is the beginning of a series of articles designed to introduce you to the different FIGs and let you know how you can get involved, too. Two of the oldest and most interconnected FIGs are the
Atom Probe Field Ion Microscopy (APFIM) FIG, which is cur- rently led by Daniel Perea, and the Focused Ion Beam (FIB) FIG, which is currently led by Josh Sugar. Tese two communi- ties are closely affiliated because most atom probe tomography (APT) experiments require needle-shaped samples, prepared using a FIB instrument. Both FIGs are individually and collab- oratively responsible for continuously investigating new tech- niques and informing members about cutting-edge hardware and soſtware developments that are impacting research groups within these scientific disciplines.
Atom Probe Field Ion Microscopy (APFIM) FIG Te APFIM FIG (Communities - Atom Probe Focused
Interest Group (AP FIG) | Microscopy Society of America) explores the frontiers of both APT and field ion microscopy (FIM) for materials characterization. Teir primary goal is to provide a forum for the exchange and discussion of information and ideas relevant to the scientific advancement and impact of the field and to increase general awareness: for example, by expanding the application of APT to new material classes or by promoting the adoption of standards for terminology and data analysis within the community. Te value of these two pivotal techniques can be traced back
to their historical origins. Te FIM was invented by the physi- cist Edwin Müller in 1951, and it allowed him to photograph the
42 doi:10.1017/S1551929522000876
surface of metal crystals at near-atomic levels. In 1967, Müller teamed up with John Panitz and S. Brooks McLane to demon- strate the 1-D atom probe, which enabled viewing of a single atom. Building on this landmark discovery, a series of advances made collectively by several research groups around the world evolved the 1-D atom probe into a 3-D atom probe, and eventu- ally into the modern APT instruments and techniques we use today.
When the APFIM FIG was formed in 2002, novel labo-
ratory-built APT instruments were just starting to become commercially available and featured an advanced counter elec- trode design with an integrated FIM system. Over the last 20 years, commercial availability has significantly increased the number of groups adopting these techniques and enabled the exploration of multiple materials classes, including ferrous and non-ferrous alloys, semiconductors, photovoltaics, ceramics, geological materials, biological materials, battery materials, and small molecule organics. Te FIG has grown to ∼30 members, including a diverse
and international body of researchers representing universi- ties, national laboratories, and industry. Te benefit of this group is that it allows field pioneers to share ideas, articulate new visions, and address ongoing challenges. For example, in 2002, the nascent commercial hardware and still-emergent data analytic techniques inspired the group to establish numerous round-robin experiments, discuss best practice data analysis, and exchange samples to establish comparisons between vari- ous labs around the world. While these are still areas of great interest, as the field has become more widely established, the APFIM FIG has also recently begun to take a more active role in organizing APT-based symposia at the annual M&M meeting, including PMC events and workshops that have helped to estab- lish standards, such as unified protocols for APT sample prepa- ration, data collection, reconstruction generation, evaluation and analysis, and the reporting of APT results. Tese PMCs are organized every 2–3 years and are hosted by the FIG as a separate 1-day workshop, just before the annual M&M meet- ing. Te first fruits of these efforts are being realized as a broad consensus of definitions for ISO terminology specific to APT and FIM are being developed. Looking ahead, the continued growth within the APT
and FIM communities is exciting, and focused groups like the APFIM FIG help facilitate that advancement. Te recent
www.microscopy-today.com • 2022 July Josh Sugar,3 David Diercks,4 KD Derr,5 and Arun Devaraj2
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