Physical and Engineering Sciences
Spring Conference Planned for May 19–21
Paul Kvam, SPES SRC Program Representative, Georgia Tech
T
he 2008 Spring Research Conference Vijay Nair of the University of come together to describe current research
on Statistics in Industry and Michigan is the honored banquet speak- efforts, identify important problems and
Technology will take place in Atlanta, er for May 20. Invited sessions include areas of application, and formulate future
Georgia, May 19–21. The conference will be DOE Computer Experiments, Statistics research directions.
held on the campus of Georgia Institute of in Nanomanufacturing, Health Process For more information, contact one of
Technology and at the Georgia Tech Hotel Monitoring, Recent European Advances in the 2008 SRC program co-chairs: Paul
and Conference Center. You may register Design of Industrial Experiments, Modeling Kvam,
pkvam@isye.gatech.edu; Jye-Chyi Lu,
now at
www.isye.gatech.edu/src2008. Credit Risk Portfolios in Retail Banking,
jclu@isye.gatech.edu; and Kwok Tsui, ktsui@
The goal of SRC is to promote cross- Multiscale Modeling, Machine Learning,
isye.gatech.edu.
disciplinary research in statistical methods Reliability in Industrial Experiments, and
for engineering, science, and technology. Analysis of Supersaturated Design. JSM Roundtables
This year’s plenary speakers include the We will cover a range of application areas,
Jeff Luner, SPES JSM Program
following: including manufacturing, logistics, health Chair-elect, Boeing
Peter Bickel,
systems, and information sciences. The
University of California, Berkeley
conference is intended to stimulate interac- Would you like to have an interesting dis-
tion among statisticians, researchers in the cussion over lunch at JSM? We are offering
James Glimm,
application areas, and industrial practitio- two opportunities this year in Denver:
University at Stony Brook
ners. Statisticians, researchers in the appli-
Zhong Lin Wang, Georgia Tech
cation areas, and industrial practitioners will
Joanne R. Wendelberger of Los Alamos
National Laboratory will discuss statisti-
cal issues in cybersecurity. New attacks
on electronic systems and information
are being developed all the time, calling
Quality and Productivity
for novel ways to investigate, analyze,
and prevent increasingly sophisticated
Conference To Focus on Data, Statistics
cybersecurity threats. Roundtable par-
ticipants will explore alternative statis-
Bruce Ankenman
tical and computational techniques for
handling potential threats.
T
he 2008 Quality and The conference will focus on theo- Dan Fitzsimmons of Boeing Commercial
Productivity Research ry and application of statistical meth- Airplanes will discuss how quality evalua-
Conference will be held on ods in industrial and business settings tion can affect product reliability models.
the beautiful shores of Lake to facilitate good data collection strat- In some industries, when nonconforming
Mendota in Madison, Wisconsin. egies, effective analysis, and connect- product is discovered, it is replaced with
The theme of the conference is ing statistical results to guiding deci- a carefully inspected item, thus having a
“With Data and Statistics, Unlock sion and policy. It will be held June positive impact on the outgoing quality
the Hidden Treasure of Knowledge.” 4–6 at the Pyle Conference Center of the production stream. You will have
Appropriately, we will honor two of on the campus of the University of the chance to discuss cases where the
our most prominent statisticians Wisconsin-Madison. increased probability of conformance
who have roots at the University of On June 3, there will be a pre- might affect the product’s reliability bud-
Wisconsin. George E. P. Box will be conference short course, titled get, and, conversely, how high product
lauded for a lifetime of achievement “Graphical Analysis of Designed reliability requirements might constrain
in statistical methods and applica- Experiments,” presented by the application of product sampling.
tions for quality and productivity, Veronica Czitrom. For more infor-
while C. F. Jeff Wu will be honored mation about conference registra-
For more information, contact SPES
for seminal contributions to statisti- tion and accommodations, go to
Program Chair-elect Jeff Luner at jeffery.
cal theory and methods for quality
www.education.wisc.edu/conferences/
j.luner@boeing.com. And keep a lookout for
and productivity. 2008QPRC.
more information about JSM 2008 SPES
activities in future issues of Amstat News.
Hope to see you in Denver. n
40 AMSTAT NEWS APRIL 2008
Page 1 |
Page 2 |
Page 3 |
Page 4 |
Page 5 |
Page 6 |
Page 7 |
Page 8 |
Page 9 |
Page 10 |
Page 11 |
Page 12 |
Page 13 |
Page 14 |
Page 15 |
Page 16 |
Page 17 |
Page 18 |
Page 19 |
Page 20 |
Page 21 |
Page 22 |
Page 23 |
Page 24 |
Page 25 |
Page 26 |
Page 27 |
Page 28 |
Page 29 |
Page 30 |
Page 31 |
Page 32 |
Page 33 |
Page 34 |
Page 35 |
Page 36 |
Page 37 |
Page 38 |
Page 39 |
Page 40 |
Page 41 |
Page 42 |
Page 43 |
Page 44 |
Page 45 |
Page 46 |
Page 47 |
Page 48 |
Page 49 |
Page 50 |
Page 51 |
Page 52 |
Page 53 |
Page 54 |
Page 55 |
Page 56 |
Page 57 |
Page 58 |
Page 59 |
Page 60 |
Page 61 |
Page 62 |
Page 63 |
Page 64 |
Page 65 |
Page 66 |
Page 67 |
Page 68 |
Page 69 |
Page 70 |
Page 71 |
Page 72 |
Page 73 |
Page 74 |
Page 75 |
Page 76