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SYSTEMS L3 SYSTEMS


Starrett L3 systems represent a new and easier solution for creating a test; performing a test; analyzing your test results; and managing test data.


L3 systems meet the requirements of today's research scientist, design engineer, quality manager or technician responsible for material characterization, verification and validation.


Unlike traditional material testing systems that


involve programming and having to know exactly what measurements are required before the test, L3 systems employ a simple methodology. You create your test method.


Your test method creates your


graph. And then you measure on the graph using a set of analysis tools.


You can measure any point and any segment anywhere along the graph.


Analyze using stress,


strain, load, distance, and time. Your measurements are displayed on your graph and shown in data tables with statistics and tolerances.


FEATURES


• Measure stress, strain, load, elongation, extension, and time results using tension, compression, flexural, cyclic, shear, and friction applications


• Create test setups using internationally accepted testing standards from ASTM, ISO, DIN, TAPPI and more, or create your own custom test methods


• Measure and calculate results graphically: - Points - Modulus, Slopes and Intercepts - Offset Yield - Min/Max/Avg - Breaks (Rate, %Drop) - Peaks and Valleys - Deltas - Rates - Hysteresis - Work/Energy - and more


• Options for digital and analog I/O and Control Logic


10


SYSTEMS


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