Volume 19 Number 6 2011 November
Feature Article
12 High-Speed Atomic Force Microscopy Enables New Applications Lars Mininni, Andrea Slade, Johannes Kindt, and Shuiqing Hu
Contents Scanning Probe Microscopy
16 Mapping Dielectric Properties with Torsionally Stabilized Nano Impedance Microscopy: Hard Materials to Biomolecules Kendra Kathan-Galipeau, Xi Chen, Bohdana Discher, and Dawn A. Bonnell
22 Advantages of Simultaneous Imaging Using an Atomic Force
Microscope Integrated with an Inverted Light Microscope W. Travis Johnson
30 A Confocal Raman-AFM Study of Graphene U. Schmidt, T. Dieing, W. Ibach, and O. Hollricher
34 Magnetic Imaging on the Nanometer Scale Using Low-Temperature
Scanning Probe Techniques M. Zech, C. Boedefeld, F. Otto, and D. Andres
Microscopy101 About the Cover
40 Keeping It Clean! Tom Levesque
Microscopy Pioneers
46 Pioneers in Optics: Sir David Brewster Michael W. Davidson
Departments
AFM images of a PTFE polymer fi lm enlarged from the 16-megapixel image in the upper left where the image width = 20 µm.
See article by Mininni et al.
7 Editorial 8 Carmichael’s Concise Review
50 Industry News 52 Product News
54 NetNotes 68 Calendar of Meetings 72 Dear Abbe 74 Index to Advertisers
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