technology products spectroscopy handheld Ftir system
A2 Technologies has expanded the sampling capability of its Exoscan handheld FTIR system. A new spherical ATR sampling interface enables the Exoscan to analyse quickly a wide range of materials typically encountered in the QA/QC lab, or at the production line. These materials include powders and granules as well as large samples such as polymer, composite and plastic sheets.
high resolution spectrometer
McPherson has introduced its Model 2061 high resolution spectrometer for emission, luminescence, Raman (strained silicon), and high temperature plasma spectra, measuring spectra to better than 0.02nm full-width half maximum. The spectrometer is available for scanning and imaging applications via two-dimensional CCD or CMOS detectors. The one-metre focal length spectrometer features bilaterally adjustable slits, multiple entrance and exit port locations, and a
scanning spectrometers for infrared lasers
The new design facilitates taking ATR
measurements using the Exoscan while minimising the need for pressure devices to achieve high quality reproducible spectra. Two versions of the spherical ATR are available: The company’s diamond ATR, suitable for a range of solid materials, and the germanium ATR, suited to analysis of carbon black- filled rubber or samples for which measurement of thin surface layers is required.
The Exoscan adds the spherical ATR capability
to its other sampling technologies, which include diffuse reflectance for absorbing or scattering samples, specular reflectance for coatings on reflectance surfaces and grazing angle reflectance for the measurement of very thin layers on metal surfaces. These sampling interfaces can be interchanged in seconds, making Exoscan an ideal QA/QC analyser for industries that must measure a wide assortment of materials either in the lab, in the field or at the production line.
www.a2technologies.com
high-precision wavelength drive to increase reproducibility. The spectrometer is designed to allow users to mount large, high angle Echelle type diffraction gratings, and its 50mm-wide focal plane is readily accessible. Oversize McPherson snap-in
gratings fitting the Model 2061 spectrometer provide 40 per cent more diffractive ruled area than predecessors. Matching, focusing
and collimating optics provide excellent light throughput and operation with f/7 aperture. Many diffraction gratings are available to tailor systems for a wide-spectral range or desired spectral resolution. Spectral resolution with a 10μm entrance slit and a 1200g/mm grating is
better than 0.02nm full width half maximum.
www.mcphersoninc.com
Ocean Optics now offers a range of its SIR scanning spectrometers for analysing infrared lasers. The company’s SIR spectrometers feature rotating-gratings, and offer high-resolution and signal-to-noise performance in the near-IR. The four models in the SIR range cover wavelengths from 900-6,500nm: SIR-2600 at 900-2,600nm; SIR-3400 at 1,000-3,400nm; SIR-5000 at 2,000- 5,000nm; and SIR-6500 at 3,000-6,500nm. All SIR spectrometers use a single point
detector and a high angular resolution-tunable grating system. The zero-backlash mechanical design provides accuracy and repeatability. This combination, along with an innovative 24-bit A/D converter, provides high spectral resolution and very high signal-to-noise data. The spectrometers feature USB 2.0-compliant interfaces that provide fast data transfers, and the included software can be used to control all SIR spectrometer’s functions. The compact design of the devices allows them to be integrated easily into OEM applications and process environments.
www.oceanoptics.com
www.electrooptics.com MARCH 2011 l electro optics 31
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