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technology products Product update


More products now online at www.electrooptics.com/products Analysis, test and measurement


dynamic interferometer


4D Technology has introduced its NanoCam Sq dynamic profiler, an instrument for measuring surface roughness on large, polished optics and optical quality surfaces. The device replaces slow, messy replication methods required by traditional workstation interferometers. By enabling on- machine roughness metrology it reduces handling and transportation of the optic, thereby increasing throughput and dramatically reducing the risk of damage to expensive, mission-critical optics. The NanoCam Sq uses dynamic interferometry,


incorporating a high-speed optical sensor that measures thousands of times faster than typical profilers. Because acquisition time is so short, the NanoCam Sq can measure despite vibration, making it possible to mount the instrument in polishing equipment, on gantries or on robots. This means the instrument can measure any location on the surface of a large optic, and that the optic can be located anywhere. The NanoCam Sq is a


nanowatt optical-to- electrical converter


Highland Technology has introduced its PH200 single-channel benchtop nanowatt optical-to-electrical converter, the first product in its ‘PH’ range of extreme-performance photonic instruments. The PH200 nanowatt photo receiver


optical receiver for laser measurement


complete system including the profiler, computer system and the company’s 4Sight advanced analysis software, which reports ISO 25178 surface roughness parameters and provides extensive 2D and 3D analysis options. www.4dtechnology.com


is a free-space optical/electrical converter that provides near shot noise performance in a rugged, compact package. The device’s photon feedback architecture delivers a bandwidth greater


than 1MHz, with an unprecedented combination of linearity, bandwidth, and dynamic range for 10nA to 100μA photodiode signals.


www.highlandtechnology.com


iC-Haus has introduced its new iC212 optical receiver for measurements of fast laser diode pulses. The device operates across a wide range of input frequencies (up to 1.4GHz) and wavelengths. The spectral sensitivity of the device ranges from the near-UV at 320nm up to IR wavelengths at 1,000nm. The active sensor area of the Si-PIN photodiode with lens measures 0.75mm², resulting in a gain of 1.625V/mW at 760nm, which allows optical powers in the sub-mW range to be detected. DC levels at the input can be compensated by means of an offset trimming feature. For easy mounting the iC212 comes with M6 screw threads and an optional fibre connector. The iC212 is suited to measuring rise


and fall times of laser beams, optical power measurements, time-of-flight measurements, and quality control in laser module production. www.ichaus.de


Distributor products


Photonic Solutions has introduced the PicoFlash laser from Teem Photonics. This is a brand new laser development at 355nm with 150kHz repetition rate and a pulse duration of 750 ps. The PicoFlash is based on a Master Oscillator Fiber Amplifier (MOFA) architecture, which enables users to vary the pulse energy or peak power and the repetition rate independently of each other while the pulse width remains constant.


BFi Optilas has launched several new products, including the Precision Photonics Corporation’s line of super broadband, high energy polarisers for visible to near-infrared applications. Also new is the 3A-P-THz power/energy sensor from Ophir, as well as a new range of short pulse DPSS lasers, produced by Ekspla (Vilnius, Lithuania), suitable for micromachining applications.


Laser Components has launched a new range of elliptical diffusers for excimer lasers, which transform an elliptical excimer beam to a uniform round spot, manufactured by Holo-Or (Rehovoth, Israel). Also new is a range of grazing incidence gratings manufactured by Optometrics, suitable for use in dye laser systems, and a line of NDIR thin film pyroelectric detectors produced by Pyreos, enabling new levels of sub-ppm detection of gasses and pollutants.


26


electro optics l MARCH 2011


www.electrooptics.com


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