SURFACEMETROLOGY


printed trace extracted profile


Printed trace false colour height reprecentation


printed trace pitch measurement


Pyramid structures commonly found on photovoltaics materials


printed trace height measurement 64 3D reprecentation of wafer bowing


printed trace width measurement (Zoomed on two trace lines)


Printed trace 3D surface


flexibility to measure glass roughness and wafer bowing; all with a single non-contact instrument.


These measurements can be automated by creating and running a Macro measurement in the Nanovea 3D Software for a quick and very efficient method in which to measure a large quantity of materials (samples).


Monitoring surface roughness, feature dimensions and flatness of solar cell material are extremely useful for quality control inspection and regulating the various production processes. The Nanovea HS1000 is a perfect choice for quality control inspections of the surface of solar materials, which can lead to higher efficiencies and increased profits for solar cell manufacturers.


www.solar-pv-management.com Issue V 2010


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