METROLOGY ROUND-UP ADVANCES IN MEASUREMENT


Measuring the invisible The dimensional measurement accuracy of the Zeiss Metrology Extension (MTX) for the Xradia 620/520 Versa X-Ray inspection system far exceeds the limits of conventional X-ray computed tomography (CT) technology. With a simple calibration to a maximum permissible error (MPE) value of (1.9 + L/100) μm, the extension is opening up new applications for X-ray microscopes in industrial manufacturing. “The miniaturisation and integration of


components in smaller devices is creating an increasing demand for high-resolution metrology in industrial manufacturing,” says Herminso Gomez, X-ray quality solutions manager at Zeiss Industrial Metrology. “Adding the Metrology Extension for Xradia Versa microscopes creates the most accurate CT metrology package in the world.” Its strengths shine in the assessment of


internal and external structures, particularly for components that are not accessible to traditional tactile or optical CMMs such as internal cavities.


Self-calibrating voltage divider Using an integrated Zener-based voltage reference and null-indicator, the new Guildline 7520 from Evolution Measurement is able to provide a self- calibration function to achieve long term, sub-ppm ratio measurements with the voltage ratios 1:1, 10:1, 100:1, 1000:1 and reverse in demanding applications. A full self-alignment cycle takes only


45 minutes and provides high-quality, accurate data for up to 145 hours. A touch screen allows for measurements to be easily programmed and fully automated. It’s possible to use the 7520 as a


“divider”, taking the voltage from an input reference and generating an output voltage based on the various ratios. This mode is typically used to calibrate a working voltage reference or the voltage measurement capability of a voltage meter or digital multi-meter (DMM). Alternatively, the device can be used as


a “comparator” to compare two external voltages. This mode is typically used to calibrate a voltage source including the DC voltage generated by a calibrator.


Minitiature press force sensor for very small forces Medical technology devices, semiconductors, electrical components and automotive parts are increasingly combining more compact dimensions with


22 /// Testing & Test Houses /// March 2021


❱❱ Internal structures such as camera lens assemblies can be measured with X-Ray metrology systems


higher performance, posing major challenges for manufacturers and suppliers, who have to achieve maximum accuracy when processing these high- precision, lightweight parts. A new, highly sensitive piezoelectric


crystal developed by Kistler guarantees extremely precise measuring results. The crystal is used in the 9323 press force sensor which is ideal for measuring very small forces in challenging industrial environments and can also be used for calibrating force sensors installed in production machinery. With a sensitivity of -32 pC/N, the


sensor can accurately measure forces of less than 5N and it is claimed that the


high-precision measuring range of the force sensor cannot be matched by any other commercially available sensor.


EDM machining specialist takes CNC co-ordinate measuring machine A&M EDM has recently purchased a large table capacity CNC co-ordinate measuring machine (CMM) from Mitutoyo. According to Steve Foster of A&M, the inspection staff have access to a range of advanced equipment but increasing demand is placing pressure on its capacity. “To rectify this, we bought a Crysta-Apex V CNC CMM from Mitutoyo UK to meet both our required capacity and our precision requirements,” he says. The recently launched Crysta-Apex-V


series of CNC CMMs deliver several advances in accuracy, speed and versatility. In addition, it is one of the new generation of CMMs that are designed for the smart factory of the future and for the connected production environment. It has an advanced real-time thermal


❱❱ The 9323 miniature press force sensor can measure extremely small forces of under 5N


compensation system enabling it to maintain high accuracy over a temperature range of 16-26°C allowing inline and line-side measurements to be automated within the manufacturing process, reducing measurement times and streamlining workflows. An active scanning feature enables high-speed measurement by tolerating discrepancies between design values and actual workpiece dimensions while maintaining the advantages of 3D optimal- path scanning.


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