• • • TEST & MEASUREMENT • • •
BIPOLAR POWER SOLUTIONS FOR PRECISION TEST AND
MEASUREMENT SYSTEMS BY ALAN WALSH,
SYSTEM APPLICATIONS ENGINEER, ANALOG DEVICES
ripple and radiated noise so as not to degrade the performance of high resolution converter signal chains. In these test and measurement applications,
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generating system supplies that are bipolar and/or isolated poses a challenge to system designers in terms of board area, switching ripple, EMI and efficiency. Data acquisition systems and digital
multimeters require low noise supplies in order to 16 ELECTRICAL ENGINEERING • JUNE 2026
n order to ensure high accuracy, precision test and measurement systems require power supply solutions with low levels of
deliver the performance of high resolution ADC signal chains without being corrupted by spurious ripple tones from switching supplies. Source measure units and dc sources/power supplies have similar requirements for minimising spurious output ripple on high resolution DAC signal chains. There is also a trend toward a higher channel
count in precision test and measurement instruments for increased parallel testing. In electrically isolated applications, these multichannel instruments have an increasing need for channel-to-channel isolation where power must be generated on a per channel basis. This is driving solutions that require a smaller
and smaller PCB footprint while maintaining performance. Implementing low noise power solutions in these applications can result in larger than desired PCB footprints and/or poor power efficiency from excessive use of LDO regulators or filter circuits.
For example, a switching power supply rail with
5mV of ripple at 1MHz would need a combined power supply rejection ratio (PSRR) of 60dB or greater from an LDO regulator and powered ADC to reduce the switching ripple seen at the ADC output to 5V or less. This would be a fraction of an LSB for a high resolution 18-bit ADC. Luckily there are solutions that are simplifying
this task through higher levels of power solution integration with µModule devices and components that deliver greater efficiencies while reducing radiated noise and switching ripple such as Silent Switcher devices and high power supply rejection ratio (PSRR) LDO regulators. Many precision test and measurement
instruments such as source measure units or power supplies require multiquadrant operation to source and measure both positive and negative signals. This requires the generation of both negative and positive supplies from a single positive supply input with low noise and in an
electricalengineeringmagazine.co.uk
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