MICROSCOPY & IMAGING
software allows for real-time visualisation of modulus, adhesion force, etc. On graphene, adhesion force and modulus showed a contrast between the underlying sapphire terraces, the steps and graphene wrinkles (Fig. 3). Compared to the terraces, the elevations around the steps exhibit a lower adhesion force and a higher modulus suggesting that the fi lm
FIG. 3. Adhesion force and modulus on graphene on a sapphire substrate acquired via Park Systems’ PinPoint mode and the corresponding surface potential imaged via sideband KPFM at the same measurement area
becomes harder at these positions. T e correlation of the nanomechanical properties with the surface potential and the sample topography indicates a possible connection of the material’s mechanical and electronic properties.
SUMMARY T e combination of diff erent AFM techniques including sideband KPFM and PinPoint mode available on Park Systems’ research AFMs allows a holistic and in-depth characterisation of 2D materials as demonstrated on a wafer- scale CVD-grown graphene on sapphire produced in an Aixtron CCS R&D
reactor. T e measurements showed a distinct correlation of the sample’s surface potential with the adhesion force and modulus indicating a connection of graphene’s electronic and mechanical properties. Characterising the highly localised mechanical and electronic properties of 2D materials enable a tailored development for future nanoelectronics applications.
Ilka M. Hermes is with Park Systems & Simonas Krotkus is with Aixtron.
www.parksystems.com
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www.scientistlive.com 49
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