This page contains a Flash digital edition of a book.
Measurement & Inspection


is doubly true with increasing automation. Especially in the aircraft world, metrology has transitioned into enabling what he terms ‘determinant manufacturing,’ enabling less tooling and more metrology-assisted assembly.


“While the equipment, software, and hardware were so capable of performing so many amazing measurement opera- tions, we felt that the operators were getting left behind,” he said. “It was diffi cult for an operator to stay abreast of the tech- nology. There was no credential or way that an operator could develop themselves professionally, to stay on top of the industry, and the certifi cation seems to play well into that.” A certifi cation program would both legitimize the fi eld and help qualify who was capable of operating effectively in this new world. The second reason was pressure from the industry itself, in the growing body of third-party service providers and their customers. “For instance, the nuclear industry requires credentialing of professionals who perform contract work, but for metrologists, that did not exist,” he said. Now, at least for portable CMMs, it does.


Initial certifi cation requires two years of experience in the


fi eld. There is also a peer review, and an applicant is required to provide four references, according to Gruver. Those refer- ences receive a letter asking for specifi c information on apti- tude and ethics. A written, proctored exam with 196 questions is then offered to qualifi ed applicants (for more information on


Software for Better Interpretation A


nother, complementary answer to increasingly capable metrology equipment is in smarter software. “You can close the skill gap by training people to understand your system, or by making your sys-


The PC-DMIS touch software in- tends to reduce training needs through a simpler interface that presents less complexity for rou- tine tasks and codifi ed GD&T.


or Cpk


tem smarter, and easier to use,” explained Brian Gudauskas, National Applications, and Support Manager for Hexagon (North Kingstown, RI). This is especially true of the large data sets that scanners and structured white light systems can pump out. In those cases, he urges the use of software that fi rst fi lters and reduces data to a meaningful subset of “what is useful.” The second step is for software to create reports and graphical interpretations of the remain- ing data. A good example is color maps of tolerances and deviations, created from com- paring measured data against CAD nominals. “However, a color map does not tell you the diameter of a cylinder,” he said. In fact, most GD&T specifi cations are feature- based, such as straightness, circularity, or perpendicularity. Software that operates on those data sets, and produces measurements of features or


gage points will make using the data in standard SPC calculations, like Cp


Another issue is in the complexity of highly capable software, such


as Hexagon’s PC-DMIS software. To satisfy a need for a simpler product, Hexagon released recently its PC-DMIS Touch. A simpler package compared to PC-DMIS, Gudauskas describes as performing a limited set of tasks. “But it does those few things very well. It also features embedded, codifi ed GD&T. One can graphically choose the GD&T symbol and the software does the rest” in the context of metrology assignment and data interpretation.


72 ManufacturingEngineeringMedia.com | January 2014


, go a long way towards solving the problem. After all, most SPC calculations were designed to use individual point measurements before the days of scanning metrology.


Page 1  |  Page 2  |  Page 3  |  Page 4  |  Page 5  |  Page 6  |  Page 7  |  Page 8  |  Page 9  |  Page 10  |  Page 11  |  Page 12  |  Page 13  |  Page 14  |  Page 15  |  Page 16  |  Page 17  |  Page 18  |  Page 19  |  Page 20  |  Page 21  |  Page 22  |  Page 23  |  Page 24  |  Page 25  |  Page 26  |  Page 27  |  Page 28  |  Page 29  |  Page 30  |  Page 31  |  Page 32  |  Page 33  |  Page 34  |  Page 35  |  Page 36  |  Page 37  |  Page 38  |  Page 39  |  Page 40  |  Page 41  |  Page 42  |  Page 43  |  Page 44  |  Page 45  |  Page 46  |  Page 47  |  Page 48  |  Page 49  |  Page 50  |  Page 51  |  Page 52  |  Page 53  |  Page 54  |  Page 55  |  Page 56  |  Page 57  |  Page 58  |  Page 59  |  Page 60  |  Page 61  |  Page 62  |  Page 63  |  Page 64  |  Page 65  |  Page 66  |  Page 67  |  Page 68  |  Page 69  |  Page 70  |  Page 71  |  Page 72  |  Page 73  |  Page 74  |  Page 75  |  Page 76  |  Page 77  |  Page 78  |  Page 79  |  Page 80  |  Page 81  |  Page 82  |  Page 83  |  Page 84  |  Page 85  |  Page 86  |  Page 87  |  Page 88  |  Page 89  |  Page 90  |  Page 91  |  Page 92  |  Page 93  |  Page 94  |  Page 95  |  Page 96  |  Page 97  |  Page 98  |  Page 99  |  Page 100  |  Page 101  |  Page 102  |  Page 103  |  Page 104  |  Page 105  |  Page 106  |  Page 107  |  Page 108  |  Page 109  |  Page 110  |  Page 111  |  Page 112  |  Page 113  |  Page 114  |  Page 115  |  Page 116  |  Page 117  |  Page 118  |  Page 119  |  Page 120  |  Page 121  |  Page 122  |  Page 123  |  Page 124  |  Page 125  |  Page 126  |  Page 127  |  Page 128  |  Page 129  |  Page 130  |  Page 131  |  Page 132  |  Page 133  |  Page 134  |  Page 135  |  Page 136  |  Page 137  |  Page 138  |  Page 139  |  Page 140