WINNERSOLAR INDUSTRY AWARD 2011
2011 Award Winner Innovation in PV Technology Award
The Solar Awards are almost upon us and UK company Taylor Hobson picked up one for innovation at the end of last year.
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CCI is a scanning interferometry technique combining a coherence correlation algorithm with a high resolution digital camera array to generate a 3D representation of the surface structure. Scanning the fringes through the surface and then processing the information gives a quantitative 3D image with 0.01nm vertical resolution. The data can then be used to generate accurate quantitative parameters such as roughness, step height, feature width, form, volume, and angle. A mode, called ‘stitching’ can be used to provide information on a wider area by combining measurements adjacent to each other. Recent developments now mean that thickness from semi- transparent thin films can is possible.
Major advantages 3D surface information in HD gives better representation of the surface structure than 2D No risk of scratches from stylus or AFM probes, so fragile surfaces are not affected or damaged by contact High speed measurement saves time in manufacturing, leading to higher yields More frequent sampling enables better control Easy to use, automatic
vital consideration for all solar cell manufacturers is the cost to the cell to the consumer and keeping costs low while improving performance is critical. The roughness of the cell surface and trench depth has a large effect upon the efficiency of the cell and the metrology requirements of both are an important part of any optimisation. For second generation thin film solar cells another parameter that is important to the performance is the film thickness of the cell. Control of these parameters is challenging but recent developments in interferometry offer the possibility of measuring these
parameters.Because of the fragile nature of the materials used in solar cell manufacture a non contact metrology solution is often necessary. A modern interferometer such as the CCI(coherence correlation interferometry) is ideal for fulfilling most of the metrology requirements of the solar cell manufacturer.
www.solar-pv-uk.com Issue 1 2012
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