FLAT PANEL DISPLAYS
displays emit very low levels of light. ‘Here we encounter what is called Mura – a Japanese term used in the display industry to describe non-uniformities,’ he said. ‘Te human eye is very sensitive to Mura when OLED screens are displaying high grey or black levels; therefore it is crucial that such non-uniformities are identified by our cameras during quality inspection.’ One of Vieworks’ other high- resolution cameras, the VP-151, offers 151-megapixel resolution and 78dB of dynamic range, which make it capable of capturing these Mura and other small defects in detail, according to Majewski. Display manufacturers also want to be able
to spot defects formed during the deposition of organic material in OLEDs, which are potentially smaller than the diffraction limit of visible light. Israeli firm InZiv was founded six months ago to provide inspection tools for the FPD industry and, as of January, had raised $2.5m in series A funding. ‘We all came from a company which was an
expert in the field of nano-optics – the ability to image light on the nano-scale – where the primary focus had been providing R&D systems for academia,’ David Lewis, CEO of InZiv, said. ‘When we saw the problems in the display industry, however, we realised that this technology holds all the critical elements to be a game-changer in the [FPD] field.’
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According to Lewis, the object resolution
of camera-based solutions for self-emitting displays is capped at around 1µm or larger – because of the diffraction limit of the imaging technique – meaning there’s nothing available in this field capable of imaging below that scale. Tis creates issues, particularly when
inspecting OLED displays, for which display manufacturers face a variety of challenges in depositing the organic material in a way that is even and without defects. Deposition
defects are hard to see using standard optical techniques, Lewis said, adding: ‘Beyond the resolution, the optical techniques offer only 2D information, meaning they provide very little information about the 3D topography of the material deposition.’ While details of InZiv’s technology remain
sensitive at this time, Lewis confirmed that the firm’s new inspection solution ‘can be used to obtain: the height information of a defect down to sub-nanometre resolution; spectral
Large flat panel display inspection requires multiple high-speed cameras August/September 2019 • Imaging and Machine Vision Europe 17
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