Graticules, Stage Micrometers, and Calibration Standards
B. Image Analysis & Microscopy (IAM) (continued) Model IAM-5
Stage Mapping – Grid Pattern
This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20mm x 50mm.
Model No. IAM-5S IAM-5M IAM-5L
Specifications Overall Size:
Image Forming Material:
Clear Aperture 8.5 µm square 180 µm square 980 µm square
1” x 3” (25mm x 75mm) Negative image/Chrome on glass (NG)
Ordering Information Cat. No.
60216-5SNG 60216-5SNGC 60216-5MNG 60216-5MNGC 60216-5LNG 60216-5LNGC
Model IAM-6
Image Analysis Micro Line/ Dot Standard
A standard specifically designed to calibrate CCD, CMOS devices and other geometric measuring imaging systems where critical measurement is important. Electronic sensors often have spurious resolution created by pixel dithering. The IAM-6 limits this calibration problem by providing known dot and line sizes to test the sensor / optical capabilities.
Specifications Overall Size:
Image: 1” x 3” (25 mm x 75 mm) Positive image/Chrome on glass (PG)
Ordering Information Cat. No.
60216-6PG 60216-6PGC
Description Image Analysis Micro Line/Dot Standard, Model IAM-6 Image Analysis Micro Line/Dot Standard, Model IAM-6, Calibrated Qty.
each each
Fax (215) 412-8450 or 8452 • email :
info@emsdiasum.com or
stacie@ems-secure.com •
www.emsdiasum.com Electron Microscopy Sciences In PA: (215) 412-8400 • Toll-Free (800) 523-5874 9
Opaque Lines 1.5 µm square 20 µm square 20 µm square
Pitch 10 µm
200 µm 1000 µm
Description
Model IAM-5S, Grids, Small Size, 10µm Pitch Model IAM-5S with Calibrated (12 pts)
Model IAM-5M, Grids, Medium Size, 200µm Pitch Model IAM-5M with Calibrated (12 pts)
Model IAM-5L, Grids, Large Size, 1000µm Pitch Model IAM-5L with Calibrated (12 pts)
Qty.
each each each each each each
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