June 4-9, 2017


Lehigh University, Bethlehem, PA USA MAIN COURSES


SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS June 5-9


SPECIALIZED COURSES


FOCUSED ION BEAM (FIB): Instrumentation and Applications June 5-9


PROBLEM SOLVING: Interpretation and Analysis of SEM/EDS/EBSD Data June 5-9


QUANTITATIVE X-RAY MICROANALYSIS:


Problem Solving using EDS and WDS Techniques June 5-9


SCANNING TRANSMISSION ELECTRON MICROSCOPY: From Fundamentals to Advanced Applications June 5-9


For more information, contact: Sharon Coe | 610.758.5133 | sharon.coe@lehigh.edu


Register and pay in full by April 14 to receive an early bird discount.


www.lehigh.edu/microscopy 47 YEARS OF EXCELLENCE


INTRODUCTION TO SEM AND EDS FOR THE NEW OPERATOR June 4


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