Microscopy Product Vendors Ted Pella, Inc.
Tel: 800-237-3526 Email:
sales@tedpella.com www.tedpella.com
High Resolution FE-SEM Sputter and Carbon Coaters
APPLICATIONS: • Life Sciences • Materials Science • Semiconductors • SEM
FEATURES: • Fine-grained, ultra-thin uniform and conformal coating • Wide choice of operating param- eters to accommodate all sample types • Purpose designed with optimized vacuum pumping system • Rotary-Planetary-Tilting stage and high resolution thickness controller • Easy to operate with fast cycle times
www.tedpella.com/cressington.htm NEW PELCO BioWave® Pro+
APPLICATIONS: • Microwave Tissue Processing for EM • Light Microscopy • Immunolabeling and Decal- cification
FEATURES: User-friendly run screens with live run- time graph • Simplified protocol selection • Report Protocol Manager App and two USB ports for simpli- fied data transfer and custom protocol upload
www.tedpella.com/microwave_html/pelco-biowave-pro-plus-microwave- system.htm
PELCO easiGlow™
APPLICATIONS: • Life Sciences • Materials Science • TEM • Tomography
FEATURES: Precise and easy vacuum settings • Short cycle times • Consistent results • Intuitive touch screen for control and display • Supports hydrophilic/ hydrophobic and negative/positive modes
www.tedpella.com/easiGlow.htm PELCO®
Silicon Nitride Support Films and TEM Supplies
APPLICATIONS: • TEM • STEM • Thin Film Research • Life Sciences • Materials Science
FEATURES: Holey SiN films down to 100nm • Solid membrane thickness of 8, 15, 35, 50 and 200nm • 3mm diameter frame fits standardTEM holders • EasyGrip™ edges for improved handling • Variety of window shapes and sizes
www.tedpella.com/TEM-supplies.htm PELCO®
Modular SEM/FIB Sample Holders and Supplies
APPLICATIONS: • SEM • FE-SEM • FIB • FIB/SEM • CLEM
FEATURES: Stage adapters for all major SEM brands • Large selection of effective and practical sample holders • Correlative microscopy sample holders • Conductive adhesives • Carbon tabs • Conductive tape
www.tedpella.com/SEM-supplies.htm
XEIA3 APPLICATIONS: Vast area cross-sections with minimal curtaining • Huge 3D tomography and volume analysis • High quality, large TEM lamel- lae with minimal amorphous layer • Delayering of state-of-the-art chips • Circuit edit and failure analy- sis in semiconductors
FEATURES: XEIA3 combines powerful plasma ion column (2µA) with immersion lens electron column (400 nA), a multitude of detectors and crossover-free beam path delivering UHR imaging and extremely fast mico-/nano- FIB machining.
https://www.tescan.com/en-us/technology/xeia3 Tescan USA
Tel: 724-772-7433 Email:
inquiries@tescan-usa.com www.tescan.com
TESCAN S8000G
APPLICATIONS: Ultra-thin TEM lamellae prepa- ration with energies down to 500 eV • Very fast cross- sectioning and large volume tomography • Field-free ultra-high resolution imaging at extremely low voltages • Sample nanocharacterization without limitations (incl. magnetic, non-conductive and beam sensitive samples) • Microanalysis (WDS, CL, EBSD, EDS) at high electron currents (up to 400 nA)
FEATURES: The S8000G is equipped with new BrightBeam™ SEM column with angle-selective and energy-filtering electron detection for superb analyti- cal imaging and novel ion column Orange™ for fast and precise sample preparation.
https://www.tescan.com/en-us/technology/fib-sem/s8000g
Companies and their Products
Optical Light Microscopy & SEM Calibration Standards
APPLICATIONS: Calibration Specimens for SEM, TEM, AFM • SPM, FIB, EDS • WDS and Optical Mi- croscopes
FEATURES: X-Ray References Calibration for SEM: PELCO X-CHECKER™ • Pelcotec™ CDMS-XY: Critical Dimension Magnification Standards • AFM Gold Calibration Kit • AFM TipChecker • Magnifica- tion Calibration Calculators • Pelcotec™ LMS-20G Magnification Calibration Standard • Stage Microm- eters • Fluorescence Reference Slides
www.tedpella.com/calibration_html/Calibration_Overview.htm
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