SOLARAWARDS2011 SHORTLISTED
rapidly spinning pump rotors, this can lead to catastrophic failure. Critical aluminium parts in this family of pumps are coated with nickel which protects against damage. In addition, they offer a hot running option that reduces the risk of undesirable deposition on pump surfaces.
Problem Solved The STP-iXA2206/iXA3206 address this problem by coating critical aluminum pump parts with nickel, which protects against gallium and selenium diffusion, and with their hot running option. This option, which permits operation at precisely controlled elevated
temperatures, without degrading pumping capability, has been shown to extend pump lifetimes by two times or more, depending on the gas being pumped.
Noteworthy 34
They are integrated mag-lev TMP pumps that deliver best-in-class performance in an easy-to-install pump with a small footprint that can provide a pumping solution to all application tools.
They have integrated controllers that allow the tool manufacturer to save valuable rack space, while eliminating cumbersome cable runs. They have been optimized for CIGS manufacturing applications.
Innovation
The combination of technology features, IP54 rating, and materials compatibility combined into a single package is special in itself, but when coupled with superior flow capability, the STP-iXA2206/3306 series of pumps provides significant advantages to users.
Customer Benefits
The nickel coating on critical pump parts, combined with the hot running option can double the operating lifetime of the pump. They also offer best-in-class pumping performance, a superior vacuum environment, and extended maintenance intervals, all of which help reduce manufacturing costs.
At the same time, these pumps are easy to install, in a variety of configurations, and have a small footprint, thereby helping to save valuable fab real estate, as well as installation costs.
Challenge
The p/n junction for light-generated charge carriers is usually created by diffusion of phosophor. During the process an unwanted emitter is created on the back of the cell which if not separated from the front could cause a short circuit. For etch isolation, plasma etching as well as wet chemical etching is applied directly after diffusion.
plasmasun ®
The most problematic topic is secure contacting of the wafer to measure isolation quality. The GP ISO-TEST .Waf is specially designed for testing edge isolation directly after the wet chemical or plasma-based process to improve the stability of the isolation process and increase the yield.
Problem Solved
The tool features two plates made of synthetic material with leveled metallic contact tips for monitoring the edge isolation directly after diffusion with the top contacts integrated into the swinging closing lids. The special design of the contacting unit achieves almost zero breaking losses. A proprietary electronic control box was designed for measuring by adjusted, constant current. Up to 4 different currents can be applied to the tips and the edge resistance for all four edges can be measured and displayed separately and interconnected in parallel. Noteworthy
There is no product in the market which can be compared to GP ISO-TEST .Waf. It
plasmasun® is a new metallization tool for in-line processing of silicon solar cells. The unique metallization system has been developed for rear busbar desposition based on our patented plasmadust® coating technology which is a combination of cold plasma and specific micro scale powders under ambient pressure. The system deposits metal films with a thickness of 1 up to 100 µm.
Challenge
Creating a new, more green coating technology for solar cell production was our main target. Towards this goal it´s another challenge to gain more cell efficiency due to a totally new metallization process. In addition our product should be able to reduce process costs for rear side busbar metallization of silicon wafers as well as the footprint compared with existing screen printing and drying combinations significantly. Actual used screen printing technology is based on expensive Si and Al pastes. They contain none environmentally sound
GP Solar GmbH GP ISO-TEST .Waf
GP ISO-TEST .Waf is a compact tool for testing the isolation resistance between front side and rear side of diffused wafers after wet chemical edge isolation. The testing tool is a successor of GP Solars existing measuring tool GP ISO-TEST WAF. In addition to a completely new design, the measuring tool offers numerous updates in technology and handling. The system is an ad-line tool for fast process control and optimization of wet chemical edge isolation process. It is specially recognized in semi-automated production lines with easy option to sample wafer and test during process run.
tests edge isolation by wet chemical etching reliably. The soft- and hardware design allows detailed classification settings for process engineers and very easy operation procedures. Therefore it is a reliable easy-to-use tool for operators.
Innovation
The GP measuring tool is the first and only inspection system on the market to measure the edge isolation process by wet chemical etching. The GP ISO-TEST .Waf is unique and captivates with its design and the ease of handling. The measuring tool delivers reliable process monitoring result and increases production efficiency.
Customer Benefits
The customers benefit from reliable results, easy handling and improved wafer quality.
www.solar-pv-management.com Issue VII 2011
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