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Product and Services Index Diamond Wire Saws (continued)


South Bay Technology, Inc. www.southbaytech.com - Diamond Wire Saw


Well Diamond Wire Saw, Inc. www.welldiamondwiresaws.com - Saws Diamond Wire


Differential Interference Contrast (DIC) Microscopy Digital Archiving


Leica Microsystems Quartz Imaging See Company Profi le Digital Holographic Microscopes


NanoAndMore USA, Inc. www.nanoandmore.com Digital Imaging and Software Gatan, Inc.


www.gatan.com


Digital Interference Contrast Microscopy Leica Microsystems


Digital Microscopes


Fluid Imaging Technologies, www.fl uidimaging.com Inc.


Keyence Corporation


LECO Corporation Leica Microsystems


www.keyence.com


- VHX-1000 Digital Microscope - VHX-500F Digital Microscope


www.leco.com www.leica-microsystems.com p. 15


Digital Optical Microscopes Dual Beam FIB/SEM


FEI Company Hitachi


- NB5000


Nanonics Imaging LTD www.nanonics.co.il - The Nanonics MultiView AFM-Raman Systems


Oregon Physics LLC - Hyperion Ion Source


Tescan USA Inc.


- VELA-3 - LYRA-3


E-Beam Lithography Integrated Dynamics


Engineering www.microscopy-today.com www.ideworld.com p. 16 www.oregon-physics.com p. 16 www.tescan.com NanoAndMore USA, Inc. www.nanoandmore.com www.fei.com http://www.hitachi-hta.com/ www.leica-microsystems.com p. 15 www.quartzimaging.com p. 11


A Guide to Microscopy Products


SEMTech Solutions, Inc. www.semtechsolutions.com - Electron Beam Lithography Systems - Add-ons for SEMs


Tescan USA Inc. - DrawBeam


EDS


Oxford Instrument NanoAnalysis


www.leica-microsystems.com p. 15 www.oxford-instruments.com


EDS Detector Repairs/Upgrades 4pi Analysis, Inc.


www.tescan.com


www.4pi.com


e2v Scientifi c Instruments www.e2vsi.com - Si(Li) EDS Detector Repairs


IXRF Systems, Inc. www.ixrfsystems.com See Company Profi le


See Our Products MAX Detector Repair Oxford Instruments www.maxdetector.com


Group LLC - Liquid Nitrogen X-Ray Detector Repair+Service


www.oxford-instruments.com p. 17


SII Nanotechnology USA, Inc. www.siintusa.com Education


Hooke College of Applied www.hookecollege.com Sciences


Electrical Characterization Imina Technologies


www.imina.ch


Nanofactory Instruments AB www.nanofactory.com Electron Backscatter Diffraction (EBSD) Bruker Nano


- QUANTAX CrystAlign EDAX Inc.


- OIM™Analysis System - Hikari Detector - DigiView IV Detector


NanoMegas Oxford Instrument


NanoAnalysis - HKL Nordlys Detectors


Thermo Fisher Scientifi c www.thermoscientifi c.com/ p. 19 microanalysis


Electron Beam Microjoining Machine


Seron Technologies Inc. www.serontech.co.kr - AIW 100


Electron Crystallography NanoMegas


nanomegas.com 25 nanomegas.com www.oxford-instruments.com www.edax.com


p. 8 p. 15


www.bruker-nano.com


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