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MANUFACTURINGAUTOMATION


contact areas. A precision printing for frontside metallization is used to align the metallization to the low resistance areas on the wafer.


Figure 5 displays the benefit for quantum efficiency for wavelength <500nm. The selective emitter


significantly improves Uoc (open circuit voltage) and Isc (short circuit current). [4]


Again a integrated approach to development is very important. An optimization process in the module production can increase the benefit of the selective emitter by shifting the cutoff of light by EVA foil to wavelength lower than 380 nm.


Wafer marking With increased work on process and tool mastering the tracking of wafers throughout the process gains more and more attention in the industry. Conergy has developed a wafer marking method, which allows tracking of individual wafers from brick to module. A barcode is printed by laser on the sidewall of the brick. Besides marking the individual brick, also the position of the wafer is marked by a laser groove running diagonal across the brick. The grooves at the sidewall of the wafer can be tracked throughout the cell process.


The optimization of the laser process has been focused on 2 main points. Maintaining a good contrast of laser marks throughout the process, a readability of 98% was achieved. Also avoiding wafer breakage because of these marks. The method has been successfully tested in pilot runs.


Conclusion


Conergy’s solar factory in Frankfurt provides a high level of automation to PV manufacturing. The factory is integrated from wafer manufacturing to module production. This has significant


AUTHORS


Karl Heinz Küsters, Tim Meyer, Mathias Kamolz, Jaak Palisar, Jürgen Grünewald, Torsten Müller, Sven Germershausen, Petra Pollow, Franz Schilling, Helmut Hoebbel, Katja Kargert of Conergy SolarModule


ACKNOWLEDGEMENTS The authors like to thank J.-U. Sachse, A. Jahnke, H. Schramm, U. Seidel, L. Bartholomäus and the Technology/ Cell/ Module/ Wafer engineering teams for their excellent work. The authors appreciate the joint work with M. Ametowobla, F. Einsele and T. Schlenker on the selective emitter.


REFERENCES


[1] Anja Schieferdecker et al. E-MRS 2010, Strasbourg, to be published, phys. stat .sol [2] M.Ametowobla, J.R. Köhler, A. Esturo-Bretón, J.H. Werner, 21st EU-PVSEC, Sept. 4-8, 2006, Dresden, Germany [3] J.R. Köhler, P. Grabitz, S.J. Eisele, T.C. Röder, J.H. Werner, 24th EU-PVSEC, Sept. 21-25, 2009, Hamburg, Germany [4] S.Germershausen, t.b. published


Fig 5: Fully automated junction box mounting


39


Fig 6: Quantum efficiency of different emitters [4]


advantages for process optimization. With the introduction of new processes into cell manufacturing the advantages of an integrated factory become even more striking.


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