ProductNews
New Lesker Rectangular Vacuum Valves As applications for Rectangular Gate Valves keep getting larger, Kurt J. Lesker Company is meeting the demand for the wider rectangular valve openings commonly used for semiconductor processing, solar panels, LCD/flat panel, and other vacuum coating applications. Our new valves are
rated up to 2 million cycles and available with 200 mm through 2,000 mm openings. Tese KJLC rectangular valves are proven ideal for vacuum applications that require large valve openings.
Kurt J. Lesker Company
www.lesker.com
ATLAS from Carl Zeiss Offers New Opportunities in the Nanoscopic Analysis of Large-Area Samples
Photo: J. Mendenhall UT, Austin
Carl Zeiss launched ATLAS™, a powerful hardware and soſtware package, which, in combination with any scanning electron microscope from Carl Zeiss, enables quick and efficient imaging of large-area
specimens with nanometer resolution. With suitable specimens, unattended operation can acquire multi-image montages that span extremely large fields of view, permitting capture of regions on the millimeter scale with resolution on the nanometer scale in a handful of hours.
Carl Zeiss SMT AG
www.smt.zeiss.com
Axio Imager Vario Upright Microscope for Materials Examinations
Carl Zeiss introduced the Axio Imager Vario, a microscope module for industrial tasks where large samples requiring various contrasting methods are examined. Te sample space of the Axio Imager Vario has been adapted to object sizes with up to 300-mm lateral and up to 250-mm vertical extension. Tis microscope
combines excellent optics with a stably designed column construc- tion. Sample stages with travel distances of up to 300 mm can be used.
Carl Zeiss MicroImaging, Inc.
www.zeiss.com/micro
EDAX Introduces OIM™ 6.0
EDAX Inc. released OIM™ 6.0—the first microanalysis package to be written for 64-bit processor and Microsoſt® Windows 7 compatibility with datasets reaching >40 million data points. OIM™ soſtware offers easier access to the most commonly used functions along with one button analysis.
Among the latest features incorporated into OIM™ 6.0 are expanded QuickGen and Template functionality, full-image area mapping, easier data rotations, and interactive page colors.
AMETEK EDAX
www.edax.com
54 The NeoScope Benchtop SEM Now at McCrone
Introducing the NeoScope Benchtop SEM, a device that economically complements both optical microscopes and traditional SEMs. Te NeoScope makes it simple to
obtain high magnification images with high resolution and large depth of field using a microscope that is as simple to operate as a digital camera, but with the powerful electron optics of an SEM. Now you’ll be seeing images with a focus and depth of field well beyond that of any optical microscope.
McCrone Microscopes & Accessories
www.mccronemicroscopes.com
OmniMet® 9.5 Image Acquisition and Analysis Software
Buehler’s new OmniMet 9.5 image acquisition and quantitative analysis soſtware improves lab efficiency and increases operator appeal compared to previous generations of the product. Specific improvements include browsing the database using a typical PC-style folder interface,
the ability to store multimedia files (such as instruction files, written procedures, and measurement reports), a preview pane to view thumbnail images of files within a folder, the ability to flip and rotate images, and overlay grids.
Beuhler
www.buehler.com
CRAIC Technologies Release New 64-Bit Windows 7 Microspectroscopy Software
CRAIC Technologies, released the 64-bit version of its MINERVA™ microspectroscopy soſtware package. Tis soſtware is designed to collect, analyze, and process microspectra™ from CRAIC microspectrophotometers running 64-bit versions of Windows 7®. MINERVA-64™
is designed for both industrial processes and scientific research. It is simple to use yet contains many advanced spectroscopic control and analysis features.
CRAIC Technologies, Inc.
www.microspectra.com
The SJ-F Series Offers High-Speed, Wide-Area Static Elimination with High-Precision Ion Balance
Te new static eliminator resolves unwanted static charges and the potential for dust adhesion, damage to electronic devices, and other production or quality concerns caused by static. KEYENCE’s SJ-F series combines powerful fans with an integrated sensing system to provide the fastest wide-area static elimination in its class. Te I.C.C control method monitors ion balance and environmental conditions, including dust buildup on the electrodes, to offer a typical ion balance of ±1 V.
Keyence Corporation
www.keyence.com/usa.php
doi:10.1017/S1551929510000763
www.microscopy-today.com • 2010 September
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