From the Editor Microscopy Today Innovation Awards
T e Microscopy Today Innovation Awards were established to honor innovative
microscopy-related products and methods that appeared in the previous year. Winning products and methods are selected on the basis of their importance and usefulness to the microscopy community. T e innovations most likely to win are those that provide better, faster, or entirely new methods of analysis by some type of microscope or microanalytical instrument. T e Evaluation Committee, under the leadership of Tom Kelly, looked for innova-
tions that will allow new and impactful experimental investigations. T ere were many innovative products and methods nominated, making selection of the awardees diffi cult. T e following ten innovations received the 2010 awards:
Adaptive Band Excitation in scanning probe microscopy JEOL ClairscopeTM integrated light microscope/SEM Direct Electron DDD sensor that detects individual electrons Dynamic Transmission Electron Microscope (DTEM) Nanonics HydraΤΜ MultiProbe BioScanned Probe Microscope Luminace Contrast illumination for light microscopy Agilent/Novelx “mySEM” with electrostatic electron optics Fischione Model 1040 NanoMill TEM specimen preparation system FEI Tecnai OsirisTM
Scanning/Transmission Electron Microscope Ultra-high-resolution atomic imaging of surfaces and bulk materials
Descriptions of these innovations are given in an article within this issue. Congratulations to the developers of these instruments and methods. Details of the nomination process for the 2011 Microscopy Today Innovation
Awards will be posted on the Microscopy Today website (
www.microscopy-today.com) on November 1, 2010. Nomination applications for the 2011 awards will be accepted through March 1, 2011.
Charles Lyman Editor-in-Chief
Publication Objective: to provide information of interest to microscopists.
Microscopy Today is a controlled-circulation trade magazine owned by the Microscopy Society of America that is published six times a year in the odd months. Editorial coverage spans all microscopy techniques including light microscopy, scanning probe microscopy, electron microscopy, ion-beam techniques, and the wide range of microanalytical methods. Readers and authors come from both the life sciences and the physical sciences. The typical length of an article is about 2,000 words plus fi gures and tables; feature articles are longer. Interested authors should consult “Instructions for Contributors” on the Microscopy Today website:
www.microscopy-today.com.
ISSN 1551-9295
Disclaimer The Microscopy Society of America and the editors cannot be held responsible for opinions, errors, or for any consequences arising from the use of information contained in Microscopy Today. The appearance of advertising in Microscopy Today does not constitute an endorsement or approval by the Microscopy Society of America of any claims or information found in the advertisements. By submitting a manuscript to Microscopy Today, the author warrants that the article is original or that the author has written permission to use copyrighted material published elsewhere. While the contents of this magazine are believed to be accurate at press time, neither the Microscopy Society of America, the editors, nor the authors can accept legal responsibility for errors or omissions.
© Copyright 2010 by the Microscopy Society of America. All rights reserved.
Editorial Staff
Charles E. Lyman Editor-in-Chief
charles.lyman@
lehigh.edu (610) 758-4249
Gennifer Levey, Production Manager
glevey@meridianartproduction.com (212) 780-0315
Ron Anderson, Executive Editor
microscopytoday@tampabay.rr.com
Phil Oshel, Technical Editor
oshel1pe@cmich.edu
Stephen Carmichael, Columnist
carmichael.stephen@
mayo.edu
Michael Davidson, Pioneers Editor
davidson@magnet.fsu.edu
Steven Barlow, Education Editor
sbarlow@sunstroke.sdsu.edu
Thomas E. Phillips, Consulting Editor
phillipst@missouri.edu
E. Ann Ellis, Microscopy 101 Editor
eann.ellis@worldnet.att.net
Paul Webster, Calendar Editor
pwebster@usc.edu
John Shields, Humor Editor
jpshield@uga.edu
Advertising Sales M.J. Mrvica Associates, Inc. 2 West Taunton Avenue, Berlin, NJ 08009
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Magazine website:
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Publisher Cambridge University Press 32 Avenue of the Americas New York, NY 10013-2473 (212) 337-5000
Circulation: 16,400 Editorial Board
Arlan Benscoter, Lehigh University John Bozzola, Southern Illinois University Peter Crozier, Arizona State University Vinayak Dravid, Northwestern University Joseph Goldstein, University of Massachusetts Bryan Huey, University of Connecticut Thomas Kelly, Imago Corporation John Mackenzie, North Carolina State Univ. Paul Maddox, University of Montreal Ania Majewska, U. Rochester Med School Greg Meeker, U.S. Geological Survey Joseph Michael, Sandia National Labs Caroline Miller, Indiana University Robert Price, University of South Carolina John Reffner, John Jay College, SUNY Ian Robertson, University of Illinois Phillip Russell, Appalachian State University Glenn Shipley, Citizen Microscopist Robert Simmons, Georgia State University Paul Voyles, University of Wisconsin Simon Watkins, University of Pittsburgh Cynthia Zeissler, Nat. Inst. of Sci. and Tech. (NIST)
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