Feature: RF


IP3 data (at high power) to produce an ACLR sweep that is accurate over a wide power range. The plot also includes measured data


(in blue). It does not reach the same optimum level for an input power level of 15dBm, due to limitations of the measurement setup. It is noticeable that as the input power level increases, the measured ACLR degrades faster, because the device’s OIP3 degrades slightly with the input/output power level, even though, ideally, it should not change. The IP3 in the device model’s dataset is a single dataset and does not change with power level; it can be thought of as the device’s small-signal IP3. This is again an instance where an X-parameter model, with its more elaborate level-dependency modelling, might produce a more accurate simulation.


EVM and temperature simulations Sys-parameter models can also be used to reliably simulate EVM. Figure 6 shows the results of a measured and simulated sweep of EVM vs


Figure 5: ACLR simulation of a 2140MHz power sweep of a 0.25W driver amplifier ADL5320, when driven by a 5MHz-wide carrier


Figure 6: Simulated and measured EVM power sweep of a wideband gain block


www.electronicsworld.co.uk April 2022 35


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