Microscopy Product Vendors
NEW PELCO® Precision Wire Saw™ APPLICATIONS: A cutting solution for all samples.
FEATURES: • Utilizes a gentle abrasive lapping action resulting in minimal kerf loss, minimal subsurface damage, and very high quality surface finish • Can be equipped with diamond-embedded blades for dry or soft materials cutting, or plain stainless for cutting using continuously circulated abrasive slurry • Precision fixturing allows for precise alignment of specimens in almost any position • Suitable for sectioning, depackaging, and other failure analysis tasks.
https://www.tedpella.com/Material-Sciences_html/PELCO-Precision-
Wire-Saw.htm.aspx
Companies and their Products
TESCAN AMBER APPLICATIONS: A field-free UHR-SEM combined with the most precise FIB for sample preparation, sub-surface and 3D analysis capabilities to take your materials nanocharacterization further
FEATURES: Ultra-high-resolution field-free SEM
imaging and nanoanalysis • The highest precision micro sample preparation • Excellent low-keV ion beam performance • Multi-site FIB process auto- mation • Multimodal FIB-SEM nanotomography • Extended field of view and easy navigation • Easy- to-use modular software interface
https://www.tescan.com/product/fib-sem-for-materials-science-tescan- amber/
SOLARIS X TESCAN
Tel: 1-724-772-7433 Email:
info@tescan.com
https://www.tescan.com/
TESCAN CLARA APPLICATIONS: Routine
study inspection of metal samples at and industrial the nanoscale
• Routine imaging of nanoparticles and agglomer- ates of all kinds • Analysis of beam sensitive and non-conductive materials
• Analysis of plants,
micro-organisms and other biological specimens • Morphological and elemental characterization of geological samples
FEATURES: Unique In-Beam BSE detector designs allow filtering of signal based on energy and take off angle • Excellent for imaging of beam-sensi- tive and non-conductive samples • Fast setup of electron beam – optimal imaging and analytical conditions guaranteed • UHR Field-free charac- terization of materials at low beam energies for maximum topography • Intuitive and precise live SEM navigation on the sample at low magnifica- tion without the need of optical navigation camera • Intuitive Essence™ software modular platform designed for effortless operation regardless of the user’s skill level
https://www.tescan.com/product/sem-for-materials-science-tescan -clara/
TESCAN TIMA
APPLICATIONS: Applicable to Mining, Geoscience and Petroleum • Understand more about geology, mineralogy and petrology • Visualize and quantify exploration samples • Link geology and metallurgy for optimal mine planning and processing plant operation
FEATURES: Configurable data structure and work- books to organize your measurements, images and results • Up to 4 EDS detectors for high-speed mea- surement of more samples, high mineral chemical resolution, good sampling statics, and high spatial resolution • Comprehensive Mineral Identification and composition tools • Optional
robotic Auto-
Loader with 100 sample magazine for 24/7 continu- ous unattended operation
https://www.tescan.com/product/sem-for-earth-sciences-tescan-tima/
APPLICATIONS: Curtaining-free large-area cross- sectioning for physical failure analysis of advanced packaging technologies • Observe the most beam- sensitive materials using low keVs ultra-high resolu- tion for surface sensitivity and high material contrast • Prepare large area FIB-cross-sections up to 1 mm wide • Effective techniques and recipes for fast and artefact-free cross-sectioning of composite sam- ples (OLED and TFT displays, MEMS devices, isola- tion dielectrics) at high currents
FEATURES: Obtain low noise, high-resolution image at low keVs in short acquisition time at FIB-SEM coincidence with the sample tilted • Live SEM-mon- itoring during FIB milling for precise end-pointing • Essence™ easy-to-use modular user interface • Easy-to-use modular software user interface • High precision nanopatterning engine for electron and ion beams • Multi-gas injection system with a variety of precursor gases
https://www.tescan.com/product/fib-sem-for-semiconductors-tescan- solaris-x/
DynaTOM
APPLICATIONS: The world‘s first dedicated dynamic micro-CT for your in-situ experimental needs • Multi-phase fluid flow in porous media • Tensile failure studies of structural alloys and composite materials • Crack propagation and fracture mechan- ics in engineered materials, geological samples and more • Hydration studies in porous materials from geoscience to consumer products • Crystal growth and mineralization in geo materials and construction materials • Plant germination, growth and decay • Freezing, melting and heating cycles in food science applications
FEATURES: Imaging of Delicate Samples • Gan- try-based Design • Continuous Scanning • High Throughput • Unique Software Tools for 4D • Dynamic Screening for Synchrotron Beamtime • Acquila, a modular software architecture for tomo- graphic acquisition and 3D reconstruction
https://www.tescan.com/product/micro-ct-for-earth-sciences-tescan- dynatom/
38
www.cambridge.org/mto
Page 1 |
Page 2 |
Page 3 |
Page 4 |
Page 5 |
Page 6 |
Page 7 |
Page 8 |
Page 9 |
Page 10 |
Page 11 |
Page 12 |
Page 13 |
Page 14 |
Page 15 |
Page 16 |
Page 17 |
Page 18 |
Page 19 |
Page 20 |
Page 21 |
Page 22 |
Page 23 |
Page 24 |
Page 25 |
Page 26 |
Page 27 |
Page 28 |
Page 29 |
Page 30 |
Page 31 |
Page 32 |
Page 33 |
Page 34 |
Page 35 |
Page 36 |
Page 37 |
Page 38 |
Page 39 |
Page 40 |
Page 41 |
Page 42 |
Page 43 |
Page 44 |
Page 45 |
Page 46 |
Page 47 |
Page 48 |
Page 49 |
Page 50 |
Page 51 |
Page 52 |
Page 53 |
Page 54 |
Page 55 |
Page 56 |
Page 57 |
Page 58 |
Page 59 |
Page 60 |
Page 61 |
Page 62 |
Page 63 |
Page 64 |
Page 65 |
Page 66 |
Page 67 |
Page 68 |
Page 69 |
Page 70 |
Page 71 |
Page 72 |
Page 73 |
Page 74 |
Page 75 |
Page 76 |
Page 77 |
Page 78 |
Page 79 |
Page 80 |
Page 81 |
Page 82 |
Page 83 |
Page 84 |
Page 85 |
Page 86 |
Page 87 |
Page 88 |
Page 89 |
Page 90 |
Page 91 |
Page 92 |
Page 93 |
Page 94 |
Page 95 |
Page 96 |
Page 97 |
Page 98 |
Page 99 |
Page 100
