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IndustryNews


McCrone Microscopes & Associates Announces Agreement to be Licensed Dealer of JEOL NeoScope Benchtop Scanning Electron Microscope


McCrone Microscopes & Accessories is now a licensed distrib- utor of the JEOL NeoScope, a benchtop scanning electron microscope (SEM). McCrone Microscopes & Accessories is the instrument sales division of Te McCrone Group, a world leader in materials analysis and microscopy. Te NeoScope can be used to supplement optical microscopic analysis for a wide variety of applications.


McCrone Microscopes & Accessories www.mccronemicroscopes.com


WITec Opens New Regional Headquarters in Singapore


WITec GmbH announced its further expansion into the Asian-Pacific markets with the opening of a new office in Singapore. In this step, WITec advances its strategy of being closer to the market and strengthening its position in the Asian-Pacific region. Te decision to launch the new operations in Singapore will accelerate WITec’s growth and reflects the philosophy of better serving the worldwide customer base.


WITec Pte. Ltd. www.WITech.de


Leica Microsystems Acquires Genetix Strengthening Life Science Technologies Portfolio


Genetix Ltd has been acquired by Leica Microsystems. Tis acquisition brings together Genetix’ expertise in developing and marketing imaging systems and soſtware for clinical and research applications with Leica Microsystems’s microscopes and other life science instrumentation. Genetix will exist as a separate business unit within Leica Microsystems, and Genetix products will continue to be marketed and sold through existing channels.


Leica Microsystems www.genetix.com


NanoSight Reports 100th Third-Party Peer-Reviewed Paper is Published


NanoSight announced that more than 100 third-party publica- tions citing the use of their nanoparticle tracking analysis (NTA) technology are now available in print. Te 100th paper was published in volume seven of the journal Environmental Chemistry and came from the group of Professor Martin Hasselöv at the University of Gothenburg: “Measurements of nanoparticle number concentrations and size distributions in contrasting aquatic environments using nanoparticle tracking analysis,” Environmental Chemistry 7(1) 67–81.


NanoSight Limited www.nanosight.com


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Siemens Awards More Than 100 Scholarships to Medical Laboratory Students


As part of the continuing effort to address the critical workforce shortage facing clinical laboratories, Siemens Healthcare Diagnostics today announced it has awarded over $120,000 in scholarships to the nation’s top medical laboratory students. More than $1.25 million in scholarships have been awarded to medical laboratory students since the scholarship program launched in 2003.


Siemens Healthcare Sector www.siemens.com/healthcare


Zeiss and ART-KON-TOR Win Design Award


Carl Zeiss announced that the Primo Vert microscope has received the 2010 reddot product design award. Te Primo Vert microscope, developed by Carl Zeiss with support from design agency ART-KON-TOR, was chosen as one of the winners from more than 4,500 international applications. Te inverted microscope is designed for fast and convenient inspection of living cells, featuring intuitive ease of use and special industri- al design.


Carl Zeiss MicroImaging, Inc. www.zeiss.com/micro


New Sales and Support Channel for Olympus Soft Imaging Solutions (OSIS) Electron Microscopy Products in U.S.


RESALTA is the official authorized sales and support partner (ASP) for all OSIS products in the electron microscopy (TEM/ SEM) field in the United States. Olympus Soſt Imaging Solutions is one of the most successful global providers of transmission and scanning electron microscopy equipment for biomedical and materials analysis applications. Te company is part of Olympus’s global framework of micro-imaging solutions and systems.


Olympus Soft Imaging Solutions, GmbH www. Olympus-SIS.com


Novel Technique for Characterization of Monolayer Segregation


Scientists at the University of Nantes (France) have recently developed a novel technique to detect and quantify grain boundary segregations using wavelength dispersive X-ray spectroscopy (WDS). Te instrument basis for the develop- ment of the new technique is the MERLIN® Field Emission Scanning Electron Microscope from Carl Zeiss, equipped with an Oxford WDS spectrometer. Te experiment was performed at the Laboratoire Génie des Matériaux et Procédés Associés Polytech´ Nantes (LGMPA).


Carl Zeiss AG www.zeiss.de


doi:10.1017/S1551929510000751 www.microscopy-today.com • 2010 September


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