 Test items and results of


Test Item Temperature Cycle Thermal Shock


High Temperature Storage


Humidity Heat Storage


Low Temperature Storage


Life Test


High Humidity Heat Life Test


Low Temperature Life Test


ESD(HBM)


Test Conditions


–40℃ 30min ↑↓25℃(5 min) 100℃ 30min


–40℃ 30min ↑↓5sec


110℃ 30min Ta=85℃


Ta=85℃ RH=85%


Ta=-40℃


Ta=25℃ If=500mA


60℃ RH=90% If=500mA


Ta=-40℃ If=500mA


Duration/ Cycle


100 cycles 100 cycles 1000 hrs 1000 hrs 1000 hrs 1000 hrs 1000 hrs 1000 hrs 1KV at 1.5kΩ;100pf 3 Times


*Criteria for Judging the Damage Item Symbol VF


Forward Voltage Reverse Current Luminous Intensity


IR


Number of Damage


0/22 0/22 0/22 0/22 0/22 0/22 0/22 0/22 0/22


Reference


JEITA ED-4701 300 303


JEITA ED-4701 200 303


EIAJED-4701 200 201


EIAJED-4701 100 103


EIAJED-4701 200 202


Tested with


Brightek standard Tested with


Brightek standard Tested with


Brightek standard MIL-STD-883D


Condition


Criteria for Judgement MIN MAX


If=350mA _ USL*1×1.1 VR=5V _ 100μA


Iv If=350mA LSL*2×0.7 _


[Note]*1USL: Upper Specification Level *2 LSL: Lower Specification Level


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