MicroscopyEducation
hands-on course with a real TEM. Th ey nearly always would
prefer more hands-on time and have commented that fewer
Arizona State University 2010 Winter School
students and lunches on-site (planned for 2009) would meet this
aim.
High Resolution
We have found that student backgrounds and experience Electron Microscopy
levels vary, so it can be diffi cult to strike a balance. Depending
Monday January 11
th
- Friday January 15
th
on the student, either too much or not enough time was spent on
Interactive lectures and laboratories on the theory
basic operation versus advanced techniques. However, we believe
and practice of HREM and STEM, small probe formation,
that it is important to introduce the students to as wide a range of
electron diffraction, image calculations and processing,
TEM-based techniques as possible so that they can be confi dent
electron energy loss and x-ray nanospectroscopy and
they are employing the correct technique to solve a problem and
focused ion beam. Demonstrations of environmental electron
not just collecting data in the way that is most familiar to them.
microscopy, focused ion beam methods and techniques of
Whereas most students felt that they lacked the knowledge
specimen preparation will be scheduled for the morning of
and/or skills required coming into the course, all left feeling
January 15, 2010.
that they had learned valuable skills to take back to their own
Instruments to be used include FEI Tecnai, CM 200,
laboratories. We have watched every group of students learn
Nova-200, Topcon 002B, JEOL 2010F, 4000EX, 2000FX,
from each other, and we have learned from them. Th e students and LEO 912.
consistently comment that they have enjoyed the experience. The registration form (available at http://le-csss.asu.edu
As instructors, we share that enjoyment and welcome the /workshops/) and check for the course fee (in the
opportunity to teach future classes.
amount of $950.00) payable to Arizona State University
should be sent by November 2, 2009 to:
References
Beth Crespo
[1] College of Microscopy website:
CHREM/LE-Center for Solid State Science
http://www.collegeofmicroscopy.com
Arizona State University
[2] Th e combined test specimen is available from any of the major
Box 879506
microscopy supply companies, such as EMS, SPI, or Ted Pella.
Tempe, AZ 85287-9506
[3] Th e NiOX test specimen is available from SPI:
A limited number of graduate student scholarships are
http://www.2spi.com/catalog/standards/niox.shtml.
provided by EM manufacturers. To apply, see the web URL above.
50
www.microscopy-today.com • 2009 September
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