Bruker AXS Microanalysis
XFlash
®
SDDs for
TEM and SEM
XFlash
®
5000 series for SEM
available with 10, 30, 40
and 60 mm
2
active area
New detectors for nanoanalysis
from the market leader in
SDD technology for EDS
The XFlash
®
Silicon Drift Detectors
are part of our QUANTAX EDS systems
Unmatched resolution at all energies
(Mn Kα ≤ 123 eV, C Kα ≤ 46 eV, F Kα ≤ 54 eV)
› superb line separation at low energies
XFlash
®
5030T for TEM
250 new L, M, N lines below 4 keV
in Bruker‘s unique atomic database
› excellent low energy element ID
› reliable low energy quantification results
www.bruker-axs-microanalysis.com
think forward
EDS
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