This page contains a Flash digital edition of a book.
Microwave-Assisted Processing
associated with the science: sample temperature control, energy
uniformity, and true wattage. A better understanding of the
energy/heat dichotomy [2] has provided the knowledge to
better design microwave-assisted protocols for a wide range of
Cross Section
applications.
In conclusion, we believe it is evident that microwave
radiation provides important improvements for many
conventional processes [2-8] and that the radiation produces
experimental results that are largely independent of a
temperature component.
Perfection
References
[1] CP Mayers, J Clin Pathol, 23 (1970) 273-275.
[2] JJ Galvez, RT Giberson, RD Cardiff, Microsc Today 12
Prepare to be amazed.
(2004) 18-23.
[3] JJ Galvez, RT Giberson, RD Cardiff, J Histotechnol 29
(2006) 113-121.
[4] RT Giberson, RL Austin, J Charlesworth, G Adamson, GA
Herrera, Ultrastruct Pathol 27 (2003) 187-196.
[5] TE Munoz, RT Giberson, R Demaree, JR Day, Neurosci
Methods 137 (2004) 133-139.
[6] SP Tinling, RT Giberson, RS Kullar, J Microsc 215 (2004)
230-235.
[7] RT Giberson, RS Demaree, Jr., RW Nordhausen J Vet Diagn
Invest 9 (1997) 61-67.
[8] MA Sanders, DM Gartner, In RT Giberson, RS Demaree,
Jr., eds. Microwave Techniques and Protocols, Humana Press,
Totowa, NJ, 2001 155-164.
SIA
1 to 39 Megapixels live and slow scan
Magnification factor of 1 on bottom mounted cameras
Diffraction beaM stop on side mounted cameras
Over 100 cameras delivered!
Prepare to be amazed.
Send us your most difficult
Cross section of oil shale
samples and we’ll show you images
showing distribution of
without deformation or contamination.
carbonates, silicates, iron
Pristine sample preparation from the
sulfide, and kerogen
JEOL ion beam Cross Section Polisher.
Affordable TEM camera
Another
systems for research,
Seeing is believing. Visit our online gallery to see a
education, healthcare,
Extreme Imaging
variety of hard, soft and composite materials
solution from
and industry since 2001
cross sections at www.jeolusa.com/CP2a.
Scientific Instruments and Applications
KFPM
2773 Heath Lane; Duluth, GA 30096
Stability • Performance • Productivity
(770) 232 7785 | www.sia-cam.com
www.jeolusa.comsalesinfo@jeol.com
32
www.microscopy-today.com
978-535-5900
• 2009 September
Page 1  |  Page 2  |  Page 3  |  Page 4  |  Page 5  |  Page 6  |  Page 7  |  Page 8  |  Page 9  |  Page 10  |  Page 11  |  Page 12  |  Page 13  |  Page 14  |  Page 15  |  Page 16  |  Page 17  |  Page 18  |  Page 19  |  Page 20  |  Page 21  |  Page 22  |  Page 23  |  Page 24  |  Page 25  |  Page 26  |  Page 27  |  Page 28  |  Page 29  |  Page 30  |  Page 31  |  Page 32  |  Page 33  |  Page 34  |  Page 35  |  Page 36  |  Page 37  |  Page 38  |  Page 39  |  Page 40  |  Page 41  |  Page 42  |  Page 43  |  Page 44  |  Page 45  |  Page 46  |  Page 47  |  Page 48  |  Page 49  |  Page 50  |  Page 51  |  Page 52  |  Page 53  |  Page 54  |  Page 55  |  Page 56  |  Page 57  |  Page 58  |  Page 59  |  Page 60  |  Page 61  |  Page 62  |  Page 63  |  Page 64  |  Page 65  |  Page 66  |  Page 67  |  Page 68  |  Page 69  |  Page 70  |  Page 71  |  Page 72  |  Page 73  |  Page 74  |  Page 75  |  Page 76